US2004058155A1PendingUtilityA1
Corrosion and erosion resistant thin film diamond coating and applications therefor
Est. expiryJan 6, 2020(expired)· nominal 20-yr term from priority
Inventors:Henry Windischmann
C23C 16/276C02F 1/46109C02F 2001/46138C23C 16/4404Y10T428/265Y10T428/26Y10T428/30
47
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Claims
Abstract
A thin film diamond coating is formed relatively slowly with a relatively low methane concentration and is identified by its Raman spectrographic characteristics. The thin film diamond, preferably 5 to 40 microns thick, provides substantially greater corrosion and erosion resistance in a corrosive environment than other thin film diamond coatings. It is believed that such thin film diamond coating is provided with enhanced chemical resistance due to its purity and quality.
Claims
exact text as granted — not AI-modified1 . A protective coating for use on a surface of an article in a corrosive environment, consisting of:
a polycrystalline diamond film material made by chemical vapor deposition having a thermal conductivity greater than 1000 W/mK and a Raman Full Width at Half Maximum of less than 10 cm −1 , said diamond film material having a thickness not greater than 150 microns.
2 . A protective coating according to claim 1 , wherein:
said diamond film material has a thickness between 5 and 40 microns.
3 . A protective coating according to claim 1 , wherein:
said diamond film material is transparent to infrared radiation.
4 . A protective coating according to claim 1 , wherein:
said diamond film material has a Raman Full Width at Half Maximum of less than 5 cm −1 .
5 . A protective coating according to claim 1 , further comprising:
a dopant added to said polycrystalline diamond film material to increase its electrical conductivity.
6 . A protective coating according to claim 5 , wherein:
said dopant is boron.
7 . An apparatus for processing a semiconductor wafer, comprising:
a) a processing chamber having an inner surface; and b) a mandrel within said chamber and adapted to receive and hold the semiconductor wafer, at least one of said inner surface and said mandrel including a protective coating comprising a polycrystalline diamond film material made by chemical vapor deposition having a thermal conductivity greater than 1000 W/mK and a Raman Full Width at Half Maximum of less than 10 cm −1 , said diamond film material having a thickness not greater than 100 microns.
8 . A apparatus according to claim 7 , wherein:
said processing chamber includes a heat source and at least one window which is substantially transparent to heat from said heat source, at least a portion of said window being provided with said protective coating.
9 . A processing chamber according to claim 7 , wherein:
said mandrel is adapted to rotate about an axis within said chamber.
10 . A processing chamber according to claim 7 , wherein:
said protective coating has a Raman Full Width at Half Maximum of less than 5 cm −1 .
11 . An electrode, comprising:
a) an electrically conductive body; b) a polycrystalline diamond film coating on said body, said coating having been made by chemical vapor deposition and having a thermal conductivity greater than 1000 W/mK and a Raman Full Width at Half Maximum of less than 10 cm −1 , said diamond coating having a thickness not greater than 40 microns; and c) a dopant in said diamond coating for increasing its electrical conductivity.
12 . An electrode according to claim 11 , wherein:
said polycrystalline diamond film has a Raman Full Width at Half Maximum of less than 5 cm −1 .
13 . A method of growing a thin film diamond coating which resists corrosion and erosion, said method comprising:
a) positioning a substrate element on a deposition mandrel in a processing chamber of a chemical vapor deposition (CVD) system b) growing a diamond coating on said substrate to a thickness of between 5 and 150 microns, the diamond coating having a Raman Full Width at Half Maximum of less than 10 cm −1 , and c) removing said substrate from said processing chamber.
14 . A method according to claim 13 , wherein:
said substrate is maintained at a temperature of greater than 700° C.
15 . A method according to claim 13 , wherein:
said diamond coating is grown at a rate of between 0.5 and 6.0 microns per hour.
16 . A method according to claim 13 , wherein:
said diamond coating has a thermal conductivity greater than 1000 W/mK.
17 . A method according to claim 13 , wherein:
said diamond coating has a Raman Full Width at Half Maximum of less than 10 cm −1 .
18 . A method according to claim 13 , wherein:
said diamond coating has a Raman Full Width at Half Maximum of less than 5 cm −1 .Join the waitlist — get patent alerts
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