US2004013204A1PendingUtilityA1
Method and apparatus to compensate imbalance of demodulator
Priority: Jul 16, 2002Filed: Jul 16, 2002Published: Jan 22, 2004
Est. expiryJul 16, 2022(expired)· nominal 20-yr term from priority
Inventors:Nati Dinur
H03D 3/00H03D 3/009H03D 1/06
36
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
Briefly, a method and apparatus to compensate for an imbalance of a demodulator by providing calibration parameters to a calibration network is provided. The apparatus may include a calibration network that may output an in-phase signal and a quadrature signal and a processor to generate calibration parameters. The processor may generate the calibration parameters by measuring an average power of the in-phase signal, an average power of the quadrature signal; and a correlation between the in-phase signal to the quadrature signal.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An apparatus comprising:
a calibration network to output an in-phase signal and a quadrature signal; and a processor to generate calibration parameters by measuring an average power of the in-phase signal, an average power of the quadrature signal and a correlation between the in-phase signal and the quadrature signal and to vary the calibration parameters until the in-phase signal and the quadrature signal converge to the substantially same value.
2 . The apparatus of claim 1 , wherein the processor is further able to vary one or more of the calibration parameters until a product of the in-phase signal with the quadrature signal converges to substantially zero.
3 . The apparatus of claim 1 , wherein the calibration network is able to compensate for impairments of the demodulator by manipulating the calibration parameters.
4 . The apparatus of claim 1 , wherein the demodulator comprises a quadrature demodulator.
5 . The apparatus of claim 1 further comprising:
a transmitter to provide a modulated test signal to the demodulator.
6 . A method comprising:
generating calibration parameters by measuring an average power of an in-phase signal, an average power of a quadrature signal and a correlation between the in-phase signal and the quadrature signal.
7 . The method of claim 6 , further comprising:
varying one or more of the calibration parameters until a product of the in-phase signal and the quadrature signal converges to substantially zero.
8 . The method of claim 6 , further comprising:
varying one or more of the calibration parameters until a power of the in-phase signal and a power of the quadrature signal converge to substantially the same value.
9 . The method of claim 6 , further comprising:
generating the in-phase signal and the quadrature signal by demodulating a modulated test signal.
10 . The method of claim 6 , wherein measuring further comprising:
averaging the in-phase signal; averaging the quadrature signal; and correlating between the in-phase signal and the quadrature signal.
11 . An apparatus comprising:
a calibration network to output an in-phase signal and a quadrature signal; a processor to generate calibration parameters by measuring an average power of the in-phase signal, an average power of the quadrature signal and a correlation between the in-phase signal and the quadrature signal and to vary one or more of the calibration parameters until the in-phase signal and the quadrature signal converge to the substantially same value; and a direct sequence spread spectrum transmitter to provide a test signal to the calibration network.
12 . The apparatus of claim 11 , wherein the processor is further able to vary the calibration parameters until a product of the in-phase signal with the quadrature signal converges to substantially zero.
13 . The apparatus of claim 11 , wherein the calibration network is able to compensate for impairments of the demodulator by manipulating the calibration parameters.
14 . The apparatus of claim 11 , wherein the demodulator comprises a quadrature demodulator.
15 . The apparatus of claim 11 , wherein said transmitter is able to provide said test signal to the demodulator.
16 . An article comprising a storage medium having stored thereon instructions that when executed result in:
generating calibration parameters by measuring an average power of an in-phase signal, an average power of quadrature signal; and a correlation between the in-phase signal to the quadrature signal.
17 . The article of claim 16 , wherein the instructions when executed further result in:
varying one or more of the calibration parameters until a product of the compensated in-phase signal and the compensated quadrature signal converges to substantially zero.
18 . The article of claim 16 , wherein the instructions when executed further result in:
varying one or more of the calibration parameters until a power of the in-phase signal and a power of the quadrature signal converge to substantially the same value.
19 . The article of claim 16 , wherein the instructions when executed further result in:
generating the in-phase signal and the quadrature signal by demodulating a modulated test signal.
20 . The article of claim 16 , wherein the instructions of measuring when executed further result in:
averaging the in-phase signal; averaging the quadrature signal; and correlating between the in-phase signal and the quadrature signal.Join the waitlist — get patent alerts
Track US2004013204A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.