CU ECP planarization by insertion of polymer treatment step between gap fill and bulk fill steps
Abstract
The method generally includes filling features in a substrate by plating metal ions from a gap fill solution onto the substrate, reducing plating activity in the features in a polymer treatment step by conditioning the substrate surface with a conditioning solution, and plating the substrate surface to a desired thickness by plating metal ions from a bulk fill solution onto the substrate surface. The method may also include treating the substrate with a conditioning solution comprising suppressors after a seed layer deposition to substantially eliminate conformal deposition in features of the substrate and plating metal ions from a plating solution onto the substrate.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for plating metal onto a substrate, comprising:
substantially filling features in the substrate by plating metal ions from a gap fill solution onto the substrate; and reducing plating activity in the features prior to completely filling the features and plating a surface of the substrate by conditioning the substrate surface with a conditioning solution.
2 . The method of claim 1 , further comprising plating the substrate with metal ions from a bulk fill solution.
3 . The method of claim 1 , wherein the conditioning solution comprises deionized water.
4 . The method of claim 1 , wherein the conditioning solution comprises suppressors.
5 . The method of claim 1 , wherein the gap fill solution comprises accelerators and suppressors.
6 . The method of claim 1 , wherein the reducing plating activity occurs during substrate transfer from a gap fill cell to a bulk fill cell by rinsing the substrate with the conditioning solution.
7 . The method of claim 2 , wherein the substrate is transferred from a gap fill cell to a conditioning cell and then to a bulk fill cell, wherein the bulk fill solution comprises levelers and accelerators.
8 . The method of claim 2 , wherein the bulk fill solution and the conditioning solution are contained in a bulk fill cell.
9 . The method of claim 2 , wherein the reducing plating activity comprises providing a period of no-current for a time sufficient to allow diffusion of the gap fill solution to form the bulk fill solution.
10 . The method of claim 1 , further comprising pre-treatment of the substrate with a solution comprising suppressors to substantially eliminate conformal deposition in the features prior to substantially filling the features.
11 . A method for plating metal onto a substrate, comprising:
disposing a substrate in a gap fill solution to substantially fill features in the substrate by plating metal ions onto the substrate; rinsing the substrate with a conditioning solution to substantially terminate plating activity in the features; transferring the substrate from the gap fill solution to a bulk fill solution; and then plating metal ions from the bulk fill solution onto the substrate.
12 . The method of claim 11 , wherein the conditioning solution comprises suppressors.
13 . The method of claim 11 , wherein the conditioning solution comprises deionized water.
14 . The method of claim 11 , wherein the gap fill solution comprises accelerators and suppressors.
15 . The method of claim 11 , wherein the bulk fill solution comprises levelers and accelerators.
16 . A method for plating metal onto a substrate, comprising:
disposing a substrate in a gap fill cell containing a gap fill solution to substantially fill features in the substrate by plating metal ions from the gap fill solution onto the substrate; transferring the substrate from the gap fill cell to a conditioning cell containing a conditioning solution to substantially terminate plating activity in the features; and transferring the substrate from the conditioning cell to a bulk fill cell containing a bulk fill solution to plate a surface of the substrate to a desired thickness by plating metal ions from the bulk fill solution onto the substrate surface.
17 . The method of claim 16 , wherein the conditioning solution comprises suppressors.
18 . The method of claim 16 , wherein the conditioning solution comprises deionized water.
19 . The method of claim 16 , wherein the gap fill solution comprises accelerators and suppressors.
20 . The method of claim 16 , wherein the bulk fill solution comprises levelers and accelerators.
21 . A method for plating metal onto a substrate, comprising:
disposing a substrate in a plating cell containing a gap fill solution to substantially fill features in the substrate by plating metal ions from the gap fill solution onto the substrate; draining the gap fill solution from the plating cell upon completion of substantially filling the features; rinsing the substrate with a conditioning solution; filling the plating cell with a bulk fill solution; and plating the surface for the substrate to a desired thickness by plating metal ions from the bulk fill solution onto the substrate.
22 . The method of claim 21 , wherein the conditioning solution comprises suppressors.
23 . The method of claim 21 , wherein the conditioning solution comprises deionized water.
24 . The method of claim 21 , wherein the gap fill solution comprises accelerators and suppressors.
25 . The method of claim 21 , wherein the bulk fill solution comprises levelers and accelerators.
26 . A method for plating metal onto a substrate, comprising:
disposing a substrate in a plating cell containing a plating solution; applying an electrical current to the plating cell to substantially fill features in the substrate by plating metal ions from the plating solution onto the substrate; terminating an electrical current supplied to the plating cell for a time sufficient to allow diffusion of the plating solution to a point of equilibrium; and then providing the electrical current to the plating cell to plate the substrate to a desired thickness.
27 . A method for plating metal onto a substrate, comprising:
treating the substrate with a conditioning solution comprising suppressors after a seed layer deposition to substantially eliminate conformal deposition in features of the substrate; and plating metal ions from a plating solution onto the substrate.Join the waitlist — get patent alerts
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