US2003217764A1PendingUtilityA1
Process and composition for removing residues from the microstructure of an object
Priority: May 23, 2002Filed: May 23, 2002Published: Nov 27, 2003
Est. expiryMay 23, 2022(expired)· nominal 20-yr term from priority
H10P 52/00B08B 7/0021G03F 7/425G03F 7/422C11D 7/5022C11D 7/3209C11D 7/32C11D 2111/22
37
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Claims
Abstract
A process for removing residues from the microstructure of an object is provided, which comprises steps of preparing a remover including carbon dioxide, an additive for removing the residues and a co-solvent dissolving the additive in said carbon dioxide at a pressurized fluid condition; and bringing the object into contact with the remover so as to remove the residues from the object. A composition for removing residues from the microstructure of an object is also provided.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A process for removing residues from the microstructure of an object comprising steps of:
preparing a remover including carbon dioxide, an additive for removing the residues, an inhibitor for suppressing residues and a co-solvent for dissolving said additive and said inhibitor in said carbon dioxide at a pressurized fluid condition; and bringing the object into contact with said remover so as to remove the residues from the object.
2 . The process according to claim 1 , wherein said additive includes quaternaryammoniumfluoride.
3 . The process according to claim 1 , wherein said additive includes tetramethylammoniumfluoride.
4 . The process according to claim 1 , wherein the concentration of said additive is between 0.001 to 0.1 weight percent.
5 . The process according to claim 1 , wherein said inhibitor includes polyhydric alcohol.
6 . The process according to claim 5 , wherein said polyhydric alcohol is a dihydric alcohol.
7 . The process according to claim 5 , wherein said dihydric alcohol is a propylene glycol.
8 . A process for removing residues from the microstructure of an object comprising steps of:
preparing a remover including carbon dioxide, an additive for removing the residues and a co-solvent for dissolving said additive in said carbon dioxide at a pressurized fluid condition; and bringing the object into contact with said remover so as to remove the residues from the object followed by a rinse step including rinse agent of which dielectric constant at a temperature and pressure of 25° C. and 1 at m is 78 or larger.
9 . The process according to claim 8 , wherein said rinse agent is selected from at least one of the compounds including water, formamide, methylformamide and methylacetamide.
10 . The process according to claim 8 , wherein said remover includes an inhibitor for suppressing residues.
11 . The process according to claim 8 , wherein said additive includes quaternaryammoniumfluoride.
12 . The process according to claim 8 , wherein said additive includes tetramethylammoniumfluoride.
13 . The process according to claim 8 , wherein the concentration of said additive is between 0.001 to 0.1 weight percent.
14 . The process according to claim 10 , wherein said inhibitor includes polyhydric alcohol.
15 . The process according to claim 14 , wherein said polyhydric alcohol is a dihydric alcohol.
16 . The process according to claim 14 , wherein said dihydric alcohol is a propylene glycol.
17 . A composition for removing residue from the microstructure of an object, comprising:
carbon dioxide, a fluoride containing additive, a co-solvent or mixture of co-solvents capable of dissolving the fluoride containing additive, and an inhibitor.
18 . The composition according to claim 17 , wherein the fluoride containing additive is a quaternary ammonium fluoride.
19 . The composition according to claim 18 , wherein the quaternary ammonium fluoride is tetramethylammonium fluoride.
20 . The composition according to claim 17 , wherein the co-solvent or mixture of co-solvents is ethanol, methanol, n-propanol, isopropanol, n-butanol or dimethylacetamide.
21 . The composition according to claim 20 , wherein the co-solvent is a mixture of ethanol and dimethylacetamide.
22 . The composition according to claim 17 , wherein the inhibitor is propylene glycol.
23 . A composition for removing residue from the microstructure of an object, comprising:
carbon dioxide, tetramethylammoniumfluoride, ethanol, dimethylacetamide, and propylene glycol.Join the waitlist — get patent alerts
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