Method and apparatus to provide a low voltage reference generation

Abstract

A method and apparatus to provide a low voltage reference generation. The apparatus includes a reference voltage generator to receive a first input voltage signal and output a reference voltage signal. A voltage level detector electrically coupled to the reference voltage generator to receive the reference voltage signal and also receive a second input voltage signal. The voltage level detector compares the second input voltage signal to the reference voltage signal for generating an output based on the compared signals.

What is claimed is:  
     
         1 . An apparatus comprising: 
 a reference voltage generator to receive a first input voltage signal and output a reference voltage signal; and    a voltage level detector electrically coupled to the reference voltage generator to receive the reference voltage signal and to receive a second input voltage signal for comparing the second input voltage signal to the reference voltage signal and generating an output based on the compared signals.    
     
     
         2 . The apparatus of  claim 1 , wherein the voltage level detector further comprises: 
 a first terminal to receive the second input voltage signal;    a second terminal to receive the reference voltage signal; and    circuitry electrically coupling the first terminal and the second terminal to an output.    
     
     
         3 . The apparatus of  claim 1 , wherein the reference voltage signal has a voltage potential that is lower than the voltage potential of the first input voltage signal.  
     
     
         4 . The apparatus of  claim 1 , wherein the voltage level detector is a differential amplifier.  
     
     
         5 . The apparatus of  claim 1 , wherein the reference voltage generator further comprises: 
 a plurality of transistors, wherein all the transistors are electrically coupled in series, the gate and drain of at least one transistor electrically coupled to a differential amplifier, the source of at least one transistor electrically coupled to a ground, and at least one transistor with its drain electrically coupled to a voltage supply and its gate coupled to an input to receive the first input voltage signal.    
     
     
         6 . The apparatus of  claim 1 , wherein the reference generator and the voltage level detector are part of a flash memory device.  
     
     
         7 . The apparatus of  claim 1 , wherein the reference voltage generator further includes a plurality of transistors.  
     
     
         8 . The apparatus of  claim 7 , wherein the reference voltage signal has a voltage potential that is the same as a voltage potential across each of the plurality of transistors.  
     
     
         9 . The apparatus of  claim 7 , wherein the plurality of transistors are in a saturation mode.  
     
     
         10 . The apparatus of  claim 7 , further including a voltage supply for providing a saturation current to the plurality of transistors.  
     
     
         11 . The apparatus of  claim 7 , wherein current for the plurality of transistors is supplied by a voltage supply.  
     
     
         12 . The apparatus of  claim 7 , wherein the reference voltage signal may be coupled to the gate and drain of any one of the transistors from the plurality of transistors.  
     
     
         13 . The apparatus of  claim 7 , wherein each of the transistors in the plurality of transistors includes similar electrical criteria.  
     
     
         14 . A method for generating a low reference voltage comprising: 
 receiving a first input voltage signal;    processing the received first input voltage signal to generate a reference voltage signal, wherein the reference voltage signal has a voltage potential that is lower than the voltage potential at the first input voltage signal; and    comparing the reference voltage signal to a second input voltage signal for generating an output.    
     
     
         15 . The method of  claim 14 , further comprising using a voltage supply to supply current to a circuit that produces the reference voltage signal.  
     
     
         16 . The method of  claim 14 , wherein processing further comprising: 
 using a plurality of transistors coupled in series;    applying the first input voltage signal to at least one transistor; and    distributing the voltage potential from the first input voltage signal equally over the plurality of transistors to output the reference voltage signal such that the reference voltage signal has the same voltage potential as the voltage potential across at least one of the transistors.    
     
     
         17 . The method of  claim 14 , further comprising providing a saturation current to a plurality of transistors.  
     
     
         18 . The method of  claim 14 , wherein comparing further comprising: 
 receiving the reference voltage signal;    receiving the second input voltage signal; and    determining whether the second input voltage signal is higher or lower than the reference voltage signal.    
     
     
         19 . The method of  claim 18 , further comprising applying the second input voltage signal to an electronic part if the voltage potential of the second input voltage signal is higher than the voltage potential of the reference voltage signal.  
     
     
         20 . A digital processing system comprising: 
 a memory; and    a processor to receive a first input voltage signal, to process the received first input voltage signal to generate a reference voltage signal, wherein the reference voltage signal has a voltage potential that is lower than the voltage potential at the first input voltage signal, and to compare the reference voltage signal to a second input voltage signal for generating an output.    
     
     
         21 . The digital processing system of  claim 20 , wherein the processor is to use a voltage supply to supply current to a circuit that produces the reference voltage signal.  
     
     
         22 . The method of  claim 20 , wherein the processor is to use a plurality of transistors coupled in series, is to apply the first input voltage signal to at least one transistor, and is to distribute the voltage potential from the first input voltage signal equally over the plurality of transistors to output the reference voltage signal such that the reference voltage signal has the same voltage potential as the voltage potential across at least one of the transistors.  
     
     
         23 . The method of  claim 20 , wherein the processor is to receive the reference voltage signal, is to receive the second input voltage signal, and is to 
 determine whether the second input voltage signal is higher or lower than the reference voltage signal.    
     
     
         24 . The method of  claim 23 , wherein the processor is to apply the second input voltage signal to an electronic part if the voltage potential of the second input voltage signal is higher than the voltage potential of the reference voltage signal.