Microscope, especially laser scanning microscope

Abstract

A microscope, especially a laser scanning microscope, with illumination over one wavelength and/or a plurality of wavelengths, wherein a controlling of the intensity of at least one wavelength is carried out by at least one rotatable interference filter which is arranged in the illumination beam path, wherein the at least one wavelength is at least partially reflected out of the illumination beam path and a plurality of filters for different wavelengths can be arranged one behind the other in the illumination beam path.

What is claimed is:  
     
         1 . A microscope, especially a laser scanning microscope, comprising: 
 means for providing illumination over at least one of a single wavelength and a plurality of wavelengths; and    means for controlling the intensity of at least one wavelength being carried out by at least one rotatable interference filter which is arranged in an illumination beam path, said at least one wavelength being at least partially reflected out of the illumination beam path.    
     
     
         2 . The microscope according to  claim 1 , wherein a plurality of filters for different wavelengths are arranged one behind the other in the illumination beam path.  
     
     
         3 . The microscope according to  claim 1 , wherein pairs of filters with identical wavelength characteristics are provided for at least one wavelength for compensating the beam offset.  
     
     
         4 . The microscope according to  claim 1 , wherein at least one filter is traversed twice in that a reflector returns the illumination light via the filter.