Semiconductor substrate cleaning system
Abstract
A modular semiconductor substrate cleaning system is provided that processes vertically oriented semiconductor substrates. The system features a plurality of cleaning modules that may include a megasonic tank-type cleaner followed by a scrubber. An input module may receive a horizontally oriented substrate and rotate the substrate to a vertical orientation, and an output module may receive a vertically oriented substrate and rotate the substrate to a horizontal orientation. Each of the modules (input, cleaning and output) has a substrate support and may be positioned such that the substrate supports of adjacent modules are equally spaced. The modules are coupled by an overhead transfer mechanism having a plurality of substrate handlers spaced the same distance (X) as the substrate supports of the modules therebelow. The transfer mechanism indexes forward and backward the distance X to simultaneously transport semiconductor substrates through the cleaning system, lifting and lowering substrates from the desired modules wafer rotation/orientation sensors, an input module cart for transporting wafers between a substrate handler of a previous tool (such as a semiconductor substrate polisher) and a substrate handler of the cleaning system are also included.
Claims
exact text as granted — not AI-modifiedThe invention claimed is:
1 . A method of automatically cleaning a semiconductor substrate within a semiconductor substrate cleaning system comprising:
cleaning a first semiconductor substrate within a sonic cleaning tank while cleaning a second semiconductor substrate within a scrubber; automatically transferring the first semiconductor substrate to the scrubber via an overhead transfer mechanism; and automatically transferring the second semiconductor substrate from the scrubber via the overhead transfer mechanism.
2 . The method of claim 1 further comprising:
receiving a semiconductor substrate in a horizontal orientation at an input module;
rotating the semiconductor substrate to a vertical orientation;
automatically transferring the vertically oriented substrate to the sonic cleaning tank via the overhead transfer mechanism for cleaning;
automatically transferring a semiconductor substrate in a vertical orientation to an output module after cleaning is complete; and
rotating the semiconductor substrate in the output module to a horizontal orientation;
wherein rotating within the input module, and rotating within the output module occur while semiconductor substrates are cleaned within the cleaning modules; and
wherein transferring semiconductor substrates from one module to another occurs simultaneously.
3 . The method of claim 1 further comprising:
providing the sonic cleaning tank having a substrate support for supporting a single semiconductor substrate in a vertical orientation;
providing the scrubber having a substrate support for supporting a single semiconductor substrate in a vertical orientation;
coupling the tank and the scrubber so as to position the substrate supports thereof a predetermined distance apart; and
movably coupling the overhead transfer mechanism above the tank and the scrubber, wherein the overhead transfer mechanism comprises a plurality of substrate handlers positioned the predetermined distance apart.
4 . A wafer cleaning system comprising a cleaning module having a wafer support which defines a wafer plane which is approximately vertical, and a wafer handler having grippers which define a wafer plane which is approximately vertical, the wafer handler being adapted to transfer a wafer to and from the wafer cleaning module.
5 . A substrate cleaning system comprising:
a megasonic tank; a scrubber; and a transfer mechanism adapted to transfer a substrate between the megasonic tank and the scrubber.
6 . A method of cleaning a substrate comprising:
introducing a substrate into a cleaning system megasonically cleaning the substrate; scrubbing the substrate; and automatically transferring the substrate between the megasonic cleaning and scrubbing.
7 . A method of cleaning a substrate comprising:
supporting a substrate in a roughly vertical position within a first cleaning apparatus cleaning the substrate in the first cleaning apparatus, transferring the substrate to a second cleaning apparatus; supporting the substrate in a roughly vertical position within the second cleaning apparatus; and cleaning the substrate in the second apparatus.Join the waitlist — get patent alerts
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