US2003180177A1PendingUtilityA1

Ag alloy film and sputtering-target for the Ag alloy film

Assignee: HITACHI METALS LTDPriority: Mar 25, 2002Filed: Mar 24, 2003Published: Sep 25, 2003
Est. expiryMar 25, 2022(expired)· nominal 20-yr term from priority
Inventors:Hideo Murata
C22C 5/06C23C 14/3414C23C 14/14
43
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Claims

Abstract

A composition of an Ag alloy film as a thin film for electronic devices and target material to form thereof by a sputtering process are disclosed. The Ag alloy film consists of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities. The Ag alloy film may be used as a wiring film or a reflective film for flat panel display devices. The sputtering-target material for forming the Ag alloy film consists of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . An Ag alloy film consisting essentially of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         2 . An Ag alloy film According to  claim 1 , which consists essentially of 0.1 to 0.5 atomic % of Sm, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         3 . An Ag alloy film According to  claim 1 , which consists essentially of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 0.5 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         4 . An Ag alloy film According to  claim 1 , which consists essentially of 0.1 to 0.5 atomic % of Sm, 0.1 to 0.5 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         5 . An Ag alloy film according to  claim 1 , which is of a wiring film for a flat panel display.  
     
     
         6 . An Ag alloy film according to  claim 1 , which is of a reflective film for a flat panel display.  
     
     
         7 . A sputtering-target for an Ag alloy film, which consists essentially of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 1.0 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         8 . A sputtering-target for an Ag alloy film according to  claim 7 , which consists essentially of 0.1 to 0.5 atomic % of Sm, 0.1 to 1.0 atomic % in total of at lest one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         9 . A sputtering-target for an Ag alloy film according to  claim 7 , which consists essentially of 0.1 to 0.5 atomic % of any one element selected from the group of Sm, Dy and Tb, 0.1 to 0.5 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.  
     
     
         10 . A sputtering-target for an Ag alloy film according to  claim 7 , which consists essentially of 0.1 to 0.5 atomic % of Sm, 0.1 to 0.5 atomic % in total of at least one element selected from the group of Au and Cu, and the balance of Ag and incidental impurities.

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