US2003173106A1PendingUtilityA1
Method for manufacturing transparent conductive panels with a low contact surface impedance
Priority: Mar 14, 2002Filed: Mar 13, 2003Published: Sep 18, 2003
Est. expiryMar 14, 2022(expired)· nominal 20-yr term from priority
Inventors:Chin-Pei Hwang
H05K 3/244H05K 2203/0361G02F 1/13439G02F 1/1345G03F 7/0035H05K 3/064G03F 7/0007G02F 1/13452H05K 2201/0326
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Claims
Abstract
A simplified manufacturing process for fabricating transparent conductive panels with a low contact surface impedance employs a yellow light and etching technique to form a wiring structure on a single layer transparent conductive film that requires high transparency, and form a wiring structure on a double layer metal film and transparent conductive film for a connecting area to externally connect to a driver circuit. The invention can achieve a higher reliability and lower cost in the processes of fabricating high resolution products.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for manufacturing transparent conductive panels that have a low contact surface impedance, comprising steps of:
(A) depositing a transparent conductive film on a transparent substrate; (B) depositing a metal film on the transparent conductive film; (C) coating a first photoresist layer on the metal film; (D) exposing the first photoresist layer by yellow light through a mask which has a first wiring pattern to form the first wiring pattern on the first photoresist layer; (E)developing the first photoresist layer to form the first wiring pattern on the first photoresist layer; (F) etching the metal film to form the first wiring pattern on the metal film; (G) removing the residual photoresist; (H) coating a second photoresist layer on the transparent conductive film and the metal film which has the first wiring pattern formed thereon; (I) exposing the second photoresist layer by yellow light through another mask which has a second wiring pattern to form the second wiring pattern on the second photoresist layer; (J) developing the second photoresist layer to form the second wiring pattern on the second photoresist layer; (K) etching the transparent conductive film to form the second wiring pattern on the transparent conductive film; and (L) removing the residual photoresist.
2 . The method of claim 1 , wherein the step (A) of depositing a transparent conductive film on a transparent substrate is achieved through a vacuum evaporating or a vacuum sputtering process.
3 . The method of claim 1 , wherein the step (B) of depositing a metal film on the transparent conductive film is achieved through a vacuum evaporating or a vacuum sputtering process.
4 . The method of claim 1 , wherein the transparent substrate is a transparent glass panel or a transparent plastic panel.
5 . The method of claim 1 , wherein the transparent conductive film is a transparent conductive oxide.
6 . The method of claim 5 , wherein the transparent conductive oxide is indium tin oxide.
7 . The method of claim 1 , wherein the metal film is made of Ag, Cr, Cu, Al, Au, Fe, Ni, W, Pt, Sn, or alloys or combinations thereof.
8 . The method of claim 1 , wherein the transparent substrate has a thickness ranging from about 0.1 to 1.1 mm.
9 . The method of claim 1 , wherein the transparent conductive film has a thickness ranging from 500 to 2000 Å.
10 . The method of claim 1 , wherein the metal film has a thickness ranging from 1000 to 2000 Å.
11 . The method of claim 1 , wherein the first photoresist layer has a thickness ranging from 5000 to 10000 Å.
12 . The method of claim 1 , wherein the second photoresist layer has a thickness ranging from 5000 to 10000 Å.
13 . A transparent conductive panel having a low contact surface impedance, comprising:
a transparent substrate; a transparent conductive film covering the transparent substrate and having a second wiring pattern formed thereon; and a metal film covering the transparent conductive film and having a first wiring pattern formed thereon.
14 . The transparent conductive panel of claim 13 , wherein the transparent substrate is a transparent glass panel or a transparent plastic panel.
15 . The transparent conductive panel of claim 13 , wherein the transparent conductive film is a transparent conductive oxide.
16 . The transparent conductive panel of claim 15 , wherein the transparent conductive oxide is indium tin oxide.
17 . The transparent conductive panel of claim 13 , wherein the metal film is made of Ag, Cr, Cu, Al, Au, Fe, Ni, W, Pt, Sn, or alloys or combinations thereof.
18 . The transparent conductive panel of claim 13 , wherein the transparent substrate has a thickness ranging from about 0.1 to 1.1 mm.
19 . The transparent conductive panel of claim 13 , wherein the transparent conductive film has a thickness ranging from 500 to 2500 Å.
20 . The transparent conductive panel of claim 13 , wherein the metal film has a thickness ranging from 1000 to 2000 Å.Join the waitlist — get patent alerts
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