Stacked photovoltaic device
Abstract
A stacked photovoltaic device comprises at least three p-i-n junction constituent devices superposed in layers, each having a p-type layer, an i-type layer and an n-type layer which are formed of silicon type non-single-crystal semiconductors. An amorphous silicon layer is used as the i-type layer of a first p-i-n junction, a microcrystalline silicon layer is used as the i-type layer of a second p-i-n junction and a microcrystalline silicon layer is used as the i-type layer of a third p-i-n junction, the first to third layers being in the order from the light-incident side. A stacked photovoltaic device can be provided which is practicable and low-cost and yet has a high reliability, and also has a high photoelectric conversion efficiency.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A stacked photovoltaic device comprising at least three p-i-n junction constituent devices superposed in layers, each having a p-type layer, an i-type layer and an n-type layer which are formed of silicon type non-single crystal semiconductors, wherein;
an amorphous silicon layer is used as the i-type layer of a first p-i-n junction, a microcrystalline silicon layer is used as the i-type layer of a second p-i-n junction and a microcrystalline silicon layer is used as the i-type layer of a third p-i-n junction; the first to third p-i-n junction layers being in the order from the light-incident side.
2 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the second p-i-n junction has a layer thickness in the range of from 0.5 μm to 1.5 μm.
3 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the third p-i-n junction has a layer thickness in the range of from 1.5 μm to 3.5 μm.
4 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the second p-i-n junction contains boron, and the boron is in a content not more than 8 ppm.
5 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the third p-i-n junction contains boron, and the boron is in a content not more than 8 ppm.
6 . The stacked photovoltaic device according to claim 1 , wherein the n-type layer of the second p-i-n junction comprises microcrystalline silicon.
7 . The stacked photovoltaic device according to claim 1 , wherein the n-type layer of the second p-i-n junction comprises a double layer consisting of a microcrystalline silicon layer and an amorphous silicon layer.
8 . The stacked photovoltaic device according to claim 1 , wherein the n-type layer of the third p-i-n junction comprises microcrystalline silicon.
9 . The stacked photovoltaic device according to claim 1 , wherein the n-type layer of the third p-i-n junction comprises a double layer consisting of a microcrystalline silicon layer and an amorphous silicon layer.
10 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layers which are the i-type layers of the second and third p-i-n junctions each have an optical absorption coefficient of 200 cm −1 or above at 950 nm.
11 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the second p-i-n junction is formed by plasma chemical vapor deposition using a high frequency power of from 0.1 GHz to 10 GHz.
12 . The stacked photovoltaic device according to claim 1 , wherein the microcrystalline silicon layer which is the i-type layer of the third p-i-n junction is formed by plasma chemical vapor deposition using a high frequency power of from 0.1 GHz to 10 GHz.
13 . The stacked photovoltaic device according to claim 1 , which is formed by a roll-to-roll system in which the layers are superposed while transporting a continuous substrate stretched over a pair of rolls.Join the waitlist — get patent alerts
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