US2003060054A1PendingUtilityA1

Plasma treatment method

Priority: Dec 26, 1997Filed: Nov 6, 2002Published: Mar 27, 2003
Est. expiryDec 26, 2017(expired)· nominal 20-yr term from priority
H10P 72/7614H10P 50/267H01J 2237/3322H01J 37/3244C23F 4/00H01J 37/32834H10P 72/722H10P 72/0602H01J 37/32532H10P 72/0402H10P 50/242H01J 37/32724
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Claims

Abstract

A plasma treatment method of etching a substrate to be processed by using a gas plasma in a treatment chamber. The method includes exhausting reaction products obtained by etching and released into a vapor phase as a gas from the treatment chamber, wherein the reaction products on an outer periphery of the substrate are more efficiently exhausted and setting a deposition probability of the reaction products in a central part of a plane of the substrate to be low and setting a deposition probability of the reaction products in a peripheral part of a plane of the substrate to be high. The setting of the deposition probability is effected by setting a temperature in the central part of the substrate higher than a temperature in the peripheral part of the substrate.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A plasma treatment method of etching a substrate to be processed by using a gas plasma in a treatment chamber, comprising the steps of: 
 exhausting reaction products obtained by etching and released into a vapor phase as a gas from the treatment chamber, wherein the reaction products on an outer periphery of the substrate are more efficiently exhausted; and    setting a deposition probability of the reaction products to be low in a central part of a plane of the substrate and setting a deposition probability of the reaction products to be high in a peripheral part of the plane of the substrate, by setting a temperature in the central part of the substrate to be higher than a temperature in the peripheral part of the substrate.

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