Test strip measuring method and device

Abstract

In a test strip measuring method in which a coloration measurement is conducted while a test strip ( 4 ) is being moved, there are detected the optical characteristics R of the ground of a test strip and the optical characteristics T of a test line ( 4 b ) which has appeared on the test strip, and the test strip is judged based on the difference or ratio between R and T. Even though the ground of the test strip presents variations in optical characteristics, and even though there are variations among samples or among test strips, such variations can be absorbed, thus assuring an accurate judgment.

1 . A test strip measuring method in which measurement is conducted while a test strip is being moved, comprising the steps of: 
 detecting the optical characteristics R of the ground of a test strip;    detecting the optical characteristics T of a test line which has appeared on said test strip; and    conducting a quantitative measurement or a qualitative judgment on said test strip based on the difference or ratio between said R and said T.    
     
     
         2 . A test strip measuring method according to  claim 1 , wherein there is estimated the point of time when said test line will appear after said test strip has started moving, or the position where said test line will appear, and a judgment of negativity is made when said test line did not appear at said estimated point of time or in said estimated position.  
     
     
         3 . A test strip measuring method according to  claim 2 , wherein 
 the test strip is held by a test strip holder,    said test strip holder is detected at the time of the start of test strip movement, there is measured a period of time T 1  from said start of test strip movement to the point of time when the forefront end of said test strip in the moving direction, has been detected, and there is estimated, based on said period of time T 1 , a period of time after which said test line will appear.    
     
     
         4 . A test strip measuring method according to  claim 1 , wherein to identify said test line, the difference between the optical characteristics of a portion which is presumed to be said test line, and the optical characteristics of the ground of said test strip, is compared with a threshold value, and said portion is identified as said test line when said difference is greater than said threshold value.  
     
     
         5 . A test strip measuring method according to  claim 1 , wherein there are a plurality of test lines.  
     
     
         6 . A test strip measuring method according to  claim 1 , wherein the result of said quantitative measurement is converted in terms of unit with the use of a calibration curve.  
     
     
         7 . A test strip measuring method in which measurement is conducted while a test strip is being moved, comprising the steps of: 
 detecting the optical characteristics C of a control line which has appeared on a test strip;    detecting the optical characteristics R of the ground of said test strip;    detecting the optical characteristics T of a test line which has appeared on said test strip; and    conducting a quantitative measurement or a qualitative judgment on said test strip with use of a determinant and a reference value, said determinant being served with the difference or ratio between said R and said T, and said reference value being served with the difference or ratio between said C and said R.    
     
     
         8 . A test strip measuring method according to  claim 7 , wherein there is estimated the point of time when said control line will appear after said test strip has started moving, or the position where said control line will appear, and it is judged that said test strip is defective or the inspection is erroneous when said control line did not appear at said estimated point of time or in said estimated position.  
     
     
         9 . A test strip measuring method according to  claim 8 , wherein after said control line has appeared, there is estimated the point of time when said test line will appear, or the position where said test line will appear, and a judgment of negativity is made when said test line did not appear at said estimated point of time or in said estimated position.  
     
     
         10 . A test strip measuring method according to  claim 8  wherein 
 said test strip is held by a test strip holder,  
 said test strip holder is detected at the time of the start of test strip movement, there is measured a period of time T 1  from said start of test strip movement to the point of time when the forefront end of said test strip in the moving direction, has been detected, and there is estimated, based on said period of time T 1 , a period of time T 2  after which said control line will appear.  
 
     
     
         11 . A test strip measuring method according to  claim 10 , wherein after said control line has appeared, there is estimated the point of time T 3  when said test line will appear, and a judgment of negativity is made when said test line did not appear at said estimated point of time T 3 .  
     
     
         12 . A test strip measuring method according to  claim 7 , wherein to identify said test line, the difference between the optical characteristics of a portion which is presumed to be said test line, and the optical characteristics of the ground of said test strip, is compared with a threshold value, and said portion is identified as said test line when said difference is greater than said threshold value.  
     
     
         13 . A test strip measuring method according to  claim 7 , wherein to identify said control line, the difference between the optical characteristics of a portion which is presumed to be said control line, and the optical characteristics of the ground of said test strip, is compared with a threshold value, and said portion is identified as said control line when said difference is greater than said threshold value.  
     
     
         14 . A test strip measuring method according to  claim 7 , wherein there are a plurality of control lines or a plurality of test lines.  
     
     
         15 . A test strip measuring method according to  claim 7 , wherein the result of said quantitative measurement is converted in terms of unit with the use of a calibration curve.  
     
     
         16 . A test strip measuring device in which measurement is conducted while a test strip is being moved, comprising: 
 a test strip holding table arranged to be reciprocatingly movable;    locking/unlocking means which is capable of locking said table to the main body of said test strip measuring device when said table is moved up to the innermost part, and which is capable of releasing this locked state;    biasing means for resiliently biasing said table in the direction in which said table springs out from said innermost part; and    resistance giving means for giving resistance to the motion of said table in the direction in which said table springs out from said innermost part.    
     
     
         17 . A test strip measuring device according to claim  16 , wherein said table is arranged to automatically travel at a uniform speed.  
     
     
         18 . A test strip measuring device according to  claim 16 , wherein said locking/unlocking means is arranged to lock said table when said table is pushed in, and to release this locked state-when said table is again pushed in.  
     
     
         19 . A test strip measuring device according to  claim 16 , wherein 
 said table has a rack, and    said resistance giving means is arranged to give a rotational resistance to a gear connected to said rack.    
     
     
         20 . A test strip measuring device according to  claim 16 , wherein said table has a rack, and said biasing means is arranged to rotationally bias a gear connected to said rack.