US2003010982A1PendingUtilityA1

Semiconductor device and fabricating method thereof

Assignee: SEMICONDUCTOR ENERGY LABPriority: Jul 24, 1997Filed: Aug 9, 2002Published: Jan 16, 2003
Est. expiryJul 24, 2017(expired)· nominal 20-yr term from priority
H10P 14/3411H10P 14/2922H10P 14/3806H10D 86/0225H10D 86/00H10D 62/40Y10S148/093Y10S148/091Y10S148/09C30B 1/023H10P 36/07
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Claims

Abstract

To effectively crystallize an amorphous semiconductor film comprising silicon by utilizing nickel element and remove nickel element contributed to the crystallization, a mask 103 is provided on an amorphous silicon film 102, oxide film patterns 107 and 108 including nickel are formed, phosphorus is doped in a region 109, thereafter, heating is performed, nickel element is diffused via paths 110 and 111 and nickel element diffuses in the amorphous silicon film and gettered by phosphorus at the region 109 by which crystallization of diffusion of nickel and gettering of nickel can be carried out simultaneously.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A semiconductor device having a CPU, said CPU comprising: 
 a crystalline semiconductor film over a substrate; and    a gate insulating film on the crystalline semiconductor film; and    a gate electrode on the gate insulating film,    wherein crystal grains in the crystalline semiconductor film extend in a lateral direction parallel to the substrate.

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