Film formation apparatus and film formation method
Abstract
There is provided a film formation apparatus for forming an organic compound film including a plurality of functional regions. A plurality of evaporation sources ( 203 a to 203 c ) are included in a film formation chamber ( 210 ), functional regions made of respective organic compounds are successively formed, and a mixed region can be further formed in an interface between the functional regions. Also, when means for applying energy to an organic compound molecule to be formed into a film in a molecular activation region ( 213 ) is provided in such a film formation chamber, a dense film can be formed.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A film formation apparatus comprising:
first exhaust means: second exhaust means; a film formation chamber comprising a first evaporation source., a second evaporation source; and means for simultaneously operating the first evaporation source and the second evaporation source., wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
2 . A film formation apparatus comprising:
first exhaust means; second exhaust means; a film formation chamber comprising a first evaporation source, a second evaporation source; and means for operating the first evaporation source and the second evaporation source in succession, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
3 . A film formation apparatus comprising:
first exhaust means; second exhaust means; a film formation chamber comprising a first evaporation source, a second evaporation source; and means for operating the first evaporation source and the second evaporation source in succession without time interruption, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
4 . A film formation apparatus according to claim 1 , wherein the degree of vacuum to be reached in the film formation chamber is 10 −6 Pa or less.
5 . A film formation apparatus according to claim 2 , wherein the degree of vacuum to be reached in the film formation chamber is 10 −6 Pa or less.
6 . A film formation apparatus according to claim 3 , wherein the degree of vacuum to be reached in the film formation chamber is 10 −6 Pa or less.
7 . A film formation apparatus according to claim 1 , wherein the first exhaust means is a cryopump and the second exhaust means is a dry pump.
8 . A film formation apparatus according to claim 2 , wherein the first exhaust means is a cryopump and the second exhaust means is a dry pump.
9 . A film formation apparatus according to claim 3 , wherein the first exhaust means is a cryopump and the second exhaust means is a dry pump.
10 . A film formation apparatus according to claim 1 , wherein an average surface roughness of the surface of the inner wall is 5 nm or less.
11 . A film formation apparatus according to claim 2 , wherein an average surface roughness of the surface of the inner wall is 5 nm or less.
12 . A film formation apparatus according to claim 3 , wherein an average surface roughness of the surface of the inner wall is 5 nm or less.
13 . A film formation apparatus comprising:
first exhaust means; second exhaust means; a film formation chamber comprising first evaporation means comprising a first plurality of evaporation sources and second evaporation means comprising a second plurality of evaporation sources: and means for simultaneously operating the first evaporation means and the second evaporation means, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
14 . A film formation apparatus comprising:
first exhaust means, second exhaust means, a film formation chamber comprising first evaporation means comprising a first plurality of evaporation sources and second evaporation means comprising a second plurality of evaporation sources; and means for operating the first evaporation means and the second evaporation means in succession, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
15 . A film formation apparatus comprising:
first exhaust means; second exhaust means; a film formation chamber comprising first evaporation means comprising a first plurality of evaporation sources and second evaporation means comprising a second plurality of evaporation sources; and means for operating the first evaporation means and the second evaporation means in succession without time interruption, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with the first exhaust means and the second exhaust means.
16 . A film formation apparatus according to claim 1 , wherein the film formation chamber further includes a light source.
17 . A film formation apparatus according to claim 2 , wherein the film formation chamber further includes a light source.
18 . A film formation apparatus according to claim 3 , wherein the film formation chamber further includes a light source.
19 . A film formation apparatus according to claim 13 , wherein the film formation chamber further includes a tight source.
20 . A film formation apparatus according to claim 14 , wherein the film formation chamber further includes a light source.
21 . A film formation apparatus according to claim 15 , wherein the film formation chamber further includes a light source.
22 . A film formation method in a film formation chamber, comprising the step of:
simultaneously operating first evaporation means and second evaporation means in the film formation chamber, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with first exhaust means and second exhaust means.
23 . A film formation method in a film formation chamber, comprising the step of:
operating the first evaporation means and the second evaporation means in succession, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with first exhaust means and second exhaust means.
24 . A film formation method in a film formation chamber, comprising the step of:
operating the first evaporation means and the second evaporation means in succession without time interruption, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished, and wherein the film formation chamber is connected with first exhaust means and second exhaust means.
25 . A film formation method in a film formation chamber, comprising the step of:
simultaneously operating first evaporation means and second evaporation means in the film formation chamber, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources. wherein a surface of an inner wall of the film formation chamber is electrolytic-polished and an average surface roughness of the surface of the inner wall is 5 nm or less, and wherein the film formation chamber is connected with a cryopump and a dry pump.
26 . A film formation method in a film formation chamber, comprising the step of:
operating the first evaporation means and the second evaporation means in succession, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources. wherein a surface of an inner wall of the film formation chamber is electrolytic-polished and an average surface roughness of the surface of the inner wall is 5 nm or less, and wherein the film formation chamber is connected with a cryopump and a dry pump.
27 . A film formation method in a film formation chamber, comprising the step of:
A operating the first evaporation means and the second evaporation means in succession without time interruption, wherein the first evaporation means comprises a first plurality of evaporation sources and the second evaporation means comprises a second plurality of evaporation sources, wherein a surface of an inner wall of the film formation chamber is electrolytic-polished and an average surface roughness of the surface of the inner wall is 5 nm or less, and wherein the film formation chamber is connected with a cryopump and a dry pump.
28 . A film formation method comprising the steps of:
vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a first organic compound film in a first film formation chamber which includes a plurality of evaporation sources; vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a second organic compound film in a second film formation chamber which includes a plurality of evaporation sources; and vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a third organic compound film in a third film formation chamber which includes a plurality of evaporation sources, wherein the first organic compound film, the second organic compound film, and the third organic compound film exhibit light emission of different colors.
29 . A film formation method comprising the steps of:
vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a first organic compound film in a first film formation chamber which includes a plurality of evaporation sources; vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a second organic compound film in a second film formation chamber which includes a plurality of evaporation sources; and vapor-depositing a plural kinds of organic compounds simultaneously and successively changing a concentration of each of the plural kinds of organic compounds to thereby form a third organic compound film in a third film formation chamber which includes a plurality of evaporation sources, wherein the first organic compound film, the second organic compound film, and the third organic compound film exhibit light emission of different colors, and wherein a surface of an inner wall of each of the first film formation chamber, the second film formation chamber, and the third film formation chamber is electrolytic-polished.
30 . A film formation method according to claim 29 , wherein an average surface roughness of the surface of the inner wall in the first film formation chamber, the second film formation chamber, and the third film formation chamber is 5 nm or less.
31 . A film formation method according claim 28 , wherein, in the same formation chamber, a first functional region comprising a first organic compound is formed and a second functional region comprising a second organic compound is formed.
32 . A film formation method according claim 29 , wherein, in the same formation chamber, a first functional region comprising a first organic compound is formed and a second functional region comprising a second organic compound is formed.
33 . A film formation method according to claim 31 , wherein a mixed region comprising the first organic compound and the second organic compound is formed in an interface between the first functional region and the second functional region.
34 . A film formation method according to claim 32 , wherein a mixed region comprising the first organic compound and the second organic compound is formed in an interface between the first functional region and the second functional region.
35 . A film formation method according to claim 31 , wherein each of the first organic compound and the second organic compound is an organic compound comprising one of a hole injection property, a hole transport property, an emitting property, a blocking property, an electron transport property, and an electron injection property and the first and second organic compounds are formed of different organic compounds.
36 . A film formation method according to claim 32 , wherein each of the first organic compound and the second organic compound is an organic compound comprising one of a hole injection property, a hole transport property, an emitting property, a blocking property, an electron transport property, and an electron injection property, and the first and second organic compounds are formed of different organic compounds.
37 . A film formation method according to claim 31 , wherein a second mixed region comprising the second organic compound and a third organic compound is formed in a part of the second functional region.
38 . A film formation method according to claim 32 , wherein a second mixed region comprising the second organic compound and a third organic compound is formed in a part of the second functional region.
39 . A film formation method according to claim 37 , wherein the third organic compound is an organic compound with a light emitting property: and the first, second, and third organic compounds are formed of different organic compounds.
40 . A film formation method according to claim 38 , wherein the third organic compound is an organic compound with a light emitting property: and the first, second, and third organic compounds are formed of different organic compounds.
41 . A film formation method according to of claim 31 , wherein the first functional region comprises an organic compound with a hole transport property, and the second functional region comprises an organic compound with an electron transport property.
42 . A film formation method according to of claim 32 , wherein the first functional region comprises an organic compound with a hole transport property, and the second functional region comprises an organic compound with an electron transport property.
43 . A film formation method according to claim 35 , wherein an aromatic diamine compound is used as the organic compound with the hole transport property.
44 . A film formation method according to claim 36 , wherein an aromatic diamine compound is used as the organic compound with the hole transport property.
45 . A film formation method according to claim 35 , wherein one of a metallic complex including quinoline skeleton, a metallic complex including benzoquinoline skeleton, an oxadiazole derivative, a triazole derivative, and a phenanthroline derivative is used as the organic compound with the electron transport property.
46 . A film formation method according to claim 36 , wherein one of a metallic complex including quinoline skeleton, a metallic complex including benzoquinoline skeleton, an oxadiazole derivative, a triazole derivative, and a phenanthroline derivative is used as the organic compound with the electron transport property.
47 . A film formation method according to claim 35 , wherein a metallic complex including quinoline skeleton, a metallic complex including benzoxazole skeleton, or a metallic complex including benzothiazole skeleton is used as the organic compound with the tight emitting property.
48 . A film formation method according to claim 36 , wherein a metallic complex including quinoline skeleton, a metallic complex including benzoxazole skeleton, or a metallic complex including benzothiazole skeleton is used as the organic compound with the light emitting property.Join the waitlist — get patent alerts
Track US2003010288A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.