US2002195332A1PendingUtilityA1
Multi-anode device and methods for sputter deposition
Priority: Jun 28, 2000Filed: Jul 22, 2002Published: Dec 26, 2002
Est. expiryJun 28, 2020(expired)· nominal 20-yr term from priority
H01J 37/3438C23C 14/0078C23C 14/354C23C 14/505C23C 14/542H01J 37/3405
32
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Claims
Abstract
A method and apparatus for vacuum coating plural articles employs a drum work holder configuration and a sputter source with a plurality of individually controlled anodes for effectively providing uniform coatings on articles disposed at different locations on the drum work holder. A small number of measured process parameters are used to control a small number of process variable to improve coating uniformity from batch to batch.
Claims
exact text as granted — not AI-modifiedWe claim:
1 . A method for controlling the application of thin coatings applied to a substrate in a vacuum sputtering system, comprising:
measuring an electrical parameter and a pressure parameter of the sputtering system during a sputtering run and producing measurement signals indicative of the parameters; producing control signals responsive to said measurement signals based on a rule set; and using said control signals to adjust in real time at least one process gas flow rate while sputtering.
2 . The method of claim 1 , wherein the electrical parameter measured is a cathode voltage and the pressure parameter measured is total system pressure.
3 . The method of claim 2 , wherein the sputtering performed is reactive sputtering and the process gas flow rates that are controlled are a reactive gas flow rate and a non-reactive gas flow rate.
4 . The method of claim 1 , wherein the control signals are determined by a fuzzy-logic computation employing the electrical parameter and the pressure parameter as inputs.
5 . The method of claim 1 , wherein the control signals are determined from a computerized look-up table based on the electrical parameter and the pressure parameter as inputs.
6 . The method of claim 5 , wherein the look-up table employs the following rule base:
Cathode Voltage
Total System Pressure
Flow Adjustment
Low
High
Decrease non-reactive gas
Low
Low
Increase reactive gas
High
High
Decrease reactive gas
High
Low
Increase non-reactive gas
OK
High
Decrease non-reactive gas
OK
Low
Increase non-reactive gas
High
OK
Decrease reactive gas
Low
OK
Increase reactive gas
7 . The method of claim 5 , wherein the look-up table employs a decision structure for adjusting the at least one process gas flow rate based on a categorization of the electrical parameter and a categorization of the pressure parameter.
8 . The method of claim 6 , wherein the non-reactive gas is argon and the reactive gas is oxygen.
9 . A method for controlling the application of a coating to a substrate in a coating system, comprising:
measuring a first system parameter and a second system parameter of the coating system during a coating run and producing measurement signals indicative of the system parameters; producing control signals responsive to said measurement signals based on a fuzzy-logic rule set; and using said control signals to control in real time at least one process variable of the coating system while applying a coating.
10 . The method of claim 9 , wherein applying the coating comprises sputtering, wherein the first system parameter measured is a cathode voltage of a sputtering source, and wherein the second system parameter measured is a gas pressure.
11 . The method of claim 10 , wherein the at least one process variable comprises a flow rate of a first gas and a flow rate of a second gas.
12 . The method of claim 9 , wherein the control signals are determined by a fuzzy-logic computation based upon the first system parameter and the second system parameter as inputs.
13 . The method of claim 9 , wherein the control signals are determined from a computerized look-up table based on the first system parameter and the second system parameter as inputs.
14 . The method of claim 9 , wherein the at least one process variable comprises a gas partial pressure.
15 . A control system for controlling the application of a coating to a substrate in a coating system, comprising:
a fuzzy-logic controller; and an interface coupled to the fuzzy-logic controller, wherein the interface is configured to receive first and second measurement signals corresponding to first and second measured system parameters, respectively, of a coating system during a coating run, wherein the fuzzy-logic controller is configured to receive the first and second measurement signals from the interface and to produce control signals responsive to said first and second measurement signals based on a fuzzy-logic rule set, and wherein the interface is configured to provide the control signals produced by the fuzzy-logic controller to the coating system to control at least one process variable of the coating system during application of a coating.
16 . The control system of claim 15 , wherein the fuzzy-logic controller is configured to produce the control signals using a cathode voltage of a sputtering source as the first measured system parameter and using a total system pressure as the second measured system parameter.
17 . The control system of claim 16 , wherein the at least one process variable comprises a flow rate of a first gas and a flow rate of a second gas.
18 . The control system of claim 15 , wherein the fuzzy-logic controller is configured to produce the control signals using a fuzzy-logic computation based upon the first measurement signal corresponding to the first measured system parameter and the second measurement signal corresponding to the second measured system parameter as inputs.
19 . The control system of claim 15 , wherein the fuzzy-logic controller is configured to produce the control signals using a computerized look-up table based on the first measurement signal corresponding to the first measured system parameter and the second measurement signal corresponding to the second measured system parameter as inputs.
20 . The control system of claim 15 , wherein the at least one process variable comprises a gas partial pressure.Join the waitlist — get patent alerts
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