Apparatuses and methods for non-destructive inspection
Abstract
An automated real-time, non-destructive inspection system usable to inspect a selected structure for a defect and visually identify a defect's location. In one embodiment, the inspection system is an x-ray inspection system mounted to an articulatable robot arm movable relative to the selected structure. A support system is attached to the articulatable robot arm that supports an imaging source on a first support portion and a detector panel on a second support portion spaced apart from the first support portion. A visual targeting system configured to identify where an imaging beam axis intersects the selected structure is positioned adjacent to the imaging source. The inspection system is configured to maneuver the imaging source and detector panel around the selected structure such that the desired areas on the selected structure may be fully inspected without having to reposition the selected structure.
Claims
exact text as granted — not AI-modifiedI claim:
1 . A real-time, non-destructive inspection system usable to inspect a selected structure, comprising:
an articulatable robot arm moveable relative to the structure; a support system attached to the articulatable robot arm, the support system having first and second support portions spaced apart from each other defining a space therebetween; an imaging source attached to the first support portion of the support system, the imaging source being in a first imaging source position relative to the structure; and an imaging detector panel attached to the second support portion of the support system and spaced apart from the imaging source, the imaging detector panel being in a first imaging detector panel position relative to the structure, the imaging source and imaging detector panel configured to provide an image of the structure, the imaging source and detector panel being moveable relative to the structure to second imaging source and detector panel positions relative to the structure, respectively, while the image of the structure is being provided.
2 . The real-time, non-destructive inspection system of claim 1 wherein the imaging source and imaging detector panel are moveable with the support system as a unit relative to the structure while the image of the structure is being provided.
3 . The real-time, non-destructive inspection system of claim 1 wherein at least one of the imaging source and the imaging detector panel is moveable relative to the other while the image of the structure is being provided.
4 . The real-time, non-destructive inspection system of claim 3 wherein the imaging source is adapted to project an imaging source beam along an imaging beam axis, and at least one of the imaging source and the imaging detector panel is moveable toward or away from the other substantially along the imaging beam axis to adjust a distance between the imaging source and the imaging detector panel.
5 . The real-time, non-destructive inspection system of claim 3 wherein the imaging source is adapted to project an imaging source beam along an imaging beam axis, and at least one of the imaging source and the imaging detector panel is moveable relative to the other in a direction substantially perpendicular to the imaging beam axis.
6 . The real-time, non-destructive inspection system of claim 1 further comprising a structure positioning system configured to movably support the structure relative to the imaging source and the imaging detector panel, and wherein the structure is moveable with the structure positioning system relative to the imaging source and the imaging detector panel while the image of the structure is being provided.
7 . The real-time, non-destructive inspection system of claim 1 wherein the imaging source is an x-ray source and the imaging detector panel is an x-ray detector panel.
8 . The real-time, non-destructive inspection system of claim 1 wherein the support system further comprises a track beam adapted to connect to the articulatable robot arm, wherein the first support portion has a first coupling end and a first distal end, the first distal end supporting the imaging source and the first coupling end being adjustably connected to the track beam, wherein the second support portion has a second coupling end and a second distal end, the second distal end supporting the imaging detector panel and the second coupling end being adjustably connected to the track beam, and wherein the first and second support portions are movable relative to each other along the track beam.
9 . A real-time x-ray inspection system usable to inspect a selected structure, comprising:
an articulatable robot arm moveable relative to the structure; a support system attached to the articulatable robot arm, the support system having first and second support portions spaced apart from each other defining a space therebetween; an x-ray source attached to the first support portion, the x-ray source being in a first x-ray source position relative to the structure; and an x-ray detector panel attached to the second support portion and spaced apart from the x-ray source, the x-ray detector panel being positioned in a first x-ray panel position relative to the structure, the x-ray source and x-ray detector panel configured to provide an x-ray image of the structure, the x-ray source and x-ray detector panel being movable relative to the structure to second x-ray source and x-ray detector panel positions relative to the structure, respectively, while the x-ray image of the structure is being provided.
10 . The real-time x-ray inspection system of claim 9 wherein the x-ray source and x-ray detector panel are moveable with the support system as a unit relative to the structure while the x-ray image of the structure is being provided.
11 . The real-time x-ray inspection system of claim 9 wherein at least one of the x-ray source and the x-ray detector panel is moveable relative to the other while the x-ray image of the structure is being provided.
12 . The real-time x-ray inspection system of claim 11 wherein the x-ray source projects an x-ray beam along an x-ray beam axis, and at least one of the x-ray source and the x-ray detector panel is moveable toward or away from the other substantially along the x-ray beam axis to adjust a distance between the x-ray source and the x-ray detector panel.
13 . The real-time x-ray inspection system of claim 9 further comprising a structure positioning system configured to moveably support the structure relative to the x-ray source and the x-ray detector panel, and wherein the structure is moveable with the structure positioning system relative to the x-ray source and the x-ray detector panel while the x-ray image of the structure is being provided.
14 . The real-time x-ray inspection system of claim 13 wherein the structure positioning system is a turntable.
15 . The real-time x-ray inspection system of claim 13 wherein the structure positioning system is a track.
16 . A real-time, non-destructive inspection system usable to inspect a selected structure and visually identify a location of a selected portion of the structure, comprising:
a support system having first and second support portions spaced apart from each other defining a space therebetween sized to receive the structure therein; an imaging source attached to the first support portion, the imaging source adapted to project an imaging source beam along an imaging beam axis; an imaging detector panel attached to the second support portion of the support system and spaced apart from the imaging source, the imaging source and detector panel being moveable as a unit relative to the structure while providing an image of the structure; and a visual targeting system having a first line generator positioned adjacent to the imaging source and positioned to project a first light plane and a second line generator positioned adjacent to the imaging source and positioned to project a second light plane intersecting the first light plane along the imaging beam axis, the second light plane being non-parallel to the first light plane.
17 . The real-time, non-destructive inspection system of claim 16 wherein the first and second line generators are laser line generators.
18 . The real-time, non-destructive inspection system of claim 16 wherein the first and second line generators are positioned such that the second light plane is orthogonal to the first light plane.
19 . A method for determining an axial distance between an imaging source and a selected portion of a structure, the structure being positioned between the imaging source and an imaging detector panel spaced apart from the imaging source, the method comprising:
detecting an image of the selected portion on the imaging detector panel when the imaging source is in a first source position; determining a first image position of the selected portion image on the detector panel when the imaging source is in the first source position; determining an axial distance between the imaging source and the imaging detector panel when the imaging source is in the first source position; moving the imaging source laterally relative to the selected portion to a second source position; determining a lateral distance moved by the imaging source between the first source position and the second source position; determining a second image position of the selected portion image on the detector panel when the imaging source is in the second source position; determining a lateral distance moved by the selected portion image on the detector panel relative to the selected portion between the first image position and the second image position; and determining the axial distance between the imaging source and the selected portion based on the axial distance between the imaging source and the imaging detector panel, the lateral distance moved by the imaging source, and the lateral distance moved by the selected portion image on the imaging detector panel.
20 . The method of claim 19 wherein detecting an image of the selected portion on the imaging detector panel comprises detecting an x-ray image of the selected portion on an x-ray image detector panel.
21 . The method of claim 19 wherein determining the axial distance between the imaging source and the selected portion includes:
determining a product by multiplying the axial distance between the imaging source and the imaging detector panel by the lateral distance moved by the imaging source between the first source position and the second source position; and
dividing the product by a sum of the lateral distance moved by the imaging source between the first source position and the second source position plus the lateral distance moved by the selected portion image on the detector panel between the first image position and the second image position.
22 . A method for determining an axial distance between an imaging source and a selected portion of a selected structure, the selected structure being positioned between the imaging source and an imaging detector panel spaced apart from the imaging source, the method comprising:
detecting an image of the selected portion on the imaging detector panel when the imaging source is in a first source position; determining a first image size of the selected portion image when the imaging source is at the first source position; moving the imaging source axially relative to the selected portion to a second source position; determining a second image size of the selected portion image when the imaging source is at the second source position; determining an axial distance moved by the imaging source between the first and second source positions; and determining the axial distance between the imaging source at the first source position and the selected portion based on the first image size, the second image size, and the axial distance moved by the imaging source.
23 . The method of claim 22 wherein detecting an image of the selected portion on the imaging detector panel comprises detecting an x-ray image of the selected portion on an x-ray detector panel.
24 . The method of claim 22 further comprising:
determining a product by multiplying the axial distance moved by the imaging source by the second image size; and
dividing the product by the difference between the first image size and the second image size.Join the waitlist — get patent alerts
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