US2002100941A1PendingUtilityA1
Thin-film semiconductor device and method of manufacturing the same
Priority: Jan 31, 2001Filed: Jan 31, 2002Published: Aug 1, 2002
Est. expiryJan 31, 2021(expired)· nominal 20-yr term from priority
H10W 72/551H10W 74/00H10W 72/884H10W 90/754H10W 90/00H10W 72/951H10W 72/075H10W 72/07331H10W 72/073H10W 72/07304H10W 72/354H10W 72/20H10W 72/07251H10W 90/734H10W 70/614H10P 72/7434H10P 72/7432H10P 72/743H10P 54/00H10P 50/613H10P 72/74
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Claims
Abstract
A thin-film semiconductor device with a reduced influence on a device formation layer in separation and a method of manufacturing the device are provided. The manufacturing method includes the step of preparing a member having a semiconductor film with a semiconductor element and/or semiconductor integrated circuit on a separation layer, the separation step of separating the member at the separation layer by a pressure of a fluid, and the chip forming step of, after the separation step, forming the semiconductor film into chips.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of manufacturing a thin-film semiconductor device, comprising:
the step of preparing a member having a semiconductor film with a semiconductor element and/or semiconductor integrated circuit on a separation layer; the separation step of separating the member at the separation layer by a pressure of a fluid; and the chip forming step of, after the separation step, forming the semiconductor film into chips.
2 . The method according to claim 1 , wherein the member is obtained by forming a porous layer on a surface of a semiconductor substrate, forming the semiconductor film on a surface of the porous layer, and then forming the semiconductor element and/or semiconductor integrated circuit.
3 . The method according to claim 2 , wherein the semiconductor film is formed on the surface of the porous layer after forming a protective film on inner walls of pores in the porous layer.
4 . The method according to claim 1 , wherein the member is obtained by forming the semiconductor element and/or semiconductor integrated circuit on a surface of a semiconductor substrate and implanting ions from the surface side to a predetermined depth to form the separation layer.
5 . The method according to claim 2 , wherein the semiconductor substrate is a single-crystal silicon substrate or a compound semiconductor substrate.
6 . The method according to claim 4 , wherein the semiconductor substrate is a single-crystal silicon substrate or a compound semiconductor substrate.
7 . The method according to claim 1 , wherein the separation step is executed by applying the pressure of the fluid to the separation layer.
8 . The method according to claim 1 , wherein after the separation step, the separation layer remaining on the semiconductor film side is removed, and then, the chip forming step is executed.
9 . The method according to claim 1 , wherein after the separation step and the chip forming step, the step of removing the separation layer remaining on the semiconductor film side is executed.
10 . A method of manufacturing a thin-film semiconductor device, comprising:
the step of preparing a member having a semiconductor film with a semiconductor element and/or semiconductor integrated circuit on a separation layer; the chip forming step of forming the member into chips in desired regions; and the separation step of, after the chip forming step, separating the member at the separation layer.
11 . A thin-film semiconductor device obtaining by processing a member having a semiconductor film with a semiconductor element and/or semiconductor integrated circuit on a separation layer, the process comprising:
the separation step of separating the member at the separation layer by a pressure of a fluid; and the chip forming step of, after the separation step, forming the semiconductor film into chips.
12 . A thin-film semiconductor device obtaining by processing a member having a semiconductor film with a semiconductor element and/or semiconductor integrated circuit on a separation layer, the process comprising:
the chip forming step of forming the member into chips in desired regions; and the separation step of, after the chip forming step, separating the member at the separation layer.Join the waitlist — get patent alerts
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