Tightening rings for integrated circuit tester heads

Abstract

The present invention relates to an assembly ring, on a test head, of a wafer that provides an interface of electric contact transfer between the test head and a circuit to be tested, including a disk, open in its central portion and meant for supporting the periphery of the wafer; a removable collar assembly of the ring on the test head; and means for rotatably connecting the disk in the vicinity of a free end of the collar.

What is claimed is:  
     
         1 . An assembly ring, on a test head, of a wafer that provides an interface of electric contact transfer between the test head and a circuit to be tested, including: 
 a disk, having an open central portion and meant for supporting a periphery of the wafer;    a collar of removable assembly of the ring on the test head;    means for fixing the disk in translation motion to a free end of the collar; and    means for making the disk freely rotatable with respect to the collar.    
     
     
         2 . The assembly ring of  claim 1 , wherein the rotatable connection means are formed of a ball bearing.  
     
     
         3 . The assembly ring of  claim 1 , wherein die disk includes insulating pads for receiving the periphery of the wafer.  
     
     
         4 . The assembly ring of  claim 3 , wherein the pads are formed by concentric rings attached to the upper surface of the disk.  
     
     
         5 . The assembly ring of  claim 1 , wherein the wafer is a printed circuit wafer.  
     
     
         6 . The assembly ring of  claim 1 , meant for a head for testing integrated circuit chips.  
     
     
         7 . The assembly ring of  claim 1 , wherein the assembly ring is meant for an integrated circuit test head.  
     
     
         8 . An integrated circuit testing device, of the type including a test head for receiving, removably, a printed circuit wafer that provides an interface of contact transfer between the test head and an integrated circuit to be tested, including a removable ring assembly on the test head of claim  1 .