US2002076891A1PendingUtilityA1

Semiconductor device and method for fabricating the same

Assignee: HYUNDAI ELECTRONICS INDPriority: Apr 2, 1999Filed: Feb 19, 2002Published: Jun 20, 2002
Est. expiryApr 2, 2019(expired)· nominal 20-yr term from priority
Inventors:Yong Chan Kim
H10D 64/011H10D 10/421H10D 10/054
37
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Claims

Abstract

A semiconductor device includes a semiconductor substrate, an insulating film having one portion below a surface of the semiconductor substrate and the other portion above the surface of the semiconductor substrate a first region, and a semiconductor layer formed on the semiconductor substrate in a second region to the same thickness as the insulating film, which improves an operation speed even at a low voltage.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A method for fabricating a semiconductor device, the method comprising: 
 oxidizing a substrate to form an insulating film having at least one gap where the substrate is exposed; and    forming a semiconductor layer on the substrate at one of the at least one gap in the insulating film, a height of the semiconductor layer being equal to a height of the insulating film.

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