US2002076891A1PendingUtilityA1
Semiconductor device and method for fabricating the same
Est. expiryApr 2, 2019(expired)· nominal 20-yr term from priority
Inventors:Yong Chan Kim
H10D 64/011H10D 10/421H10D 10/054
37
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Claims
Abstract
A semiconductor device includes a semiconductor substrate, an insulating film having one portion below a surface of the semiconductor substrate and the other portion above the surface of the semiconductor substrate a first region, and a semiconductor layer formed on the semiconductor substrate in a second region to the same thickness as the insulating film, which improves an operation speed even at a low voltage.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for fabricating a semiconductor device, the method comprising:
oxidizing a substrate to form an insulating film having at least one gap where the substrate is exposed; and forming a semiconductor layer on the substrate at one of the at least one gap in the insulating film, a height of the semiconductor layer being equal to a height of the insulating film.Join the waitlist — get patent alerts
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