US2002056401A1PendingUtilityA1
Precursor solutions and methods of using same
Priority: Oct 23, 2000Filed: May 14, 2001Published: May 16, 2002
Est. expiryOct 23, 2020(expired)· nominal 20-yr term from priority
C30B 7/005Y10S505/734C30B 29/22H10N 60/0548H10N 60/0324H10N 60/01
43
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Claims
Abstract
Superconductor precursor solutions are disclosed. The precursor solutions contain, for example, a salt of a rare earth metal, a salt of an alkaline earth metal and a salt of a transition metal. The precursor solutions can optionally include a Lewis base. The precursor solutions can be processed relatively quickly to provide a relatively thick and good quality intermediate of a rare earth metal-alkaline earth metal-transition metal oxide.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method, comprising:
disposing a precursor solution onto a surface of a layer to form a precursor film, the precursor film including a salt of a rare earth metal, a salt of an alkaline earth metal and a carboxylate salt of a transition metal, with the proviso that the carboxylate salt of the transition metal salt is not a trifluoroacetate salt of the transition metal; and treating the precursor film to form an intermediate of a rare earth metal-alkaline earth metal-transition metal oxide.
2 . The method of claim 1 , wherein the precursor film is treated for less than about five hours.
3 . The method of claim 1 , the precursor solution further comprises a Lewis base.
4 . The method of claim 3 , wherein the Lewis base comprises a nitrogen-containing compound.
5 . The method of claim 4 , wherein the nitrogen-containing compound is selected from the group consisting of ammonia and amines.
6 . The method of claim 1 , wherein the layer of the intermediate has a thickness of at least about one micrometer.
7 . The method of claim 1 , further comprising treating the layer of the intermediate to form a layer of a rare earth metal-alkaline earth metal-transition metal oxide having a critical current density of at least about 0.5×10 6 Amperes per square centimeter.
8 . The method of claim 1 , wherein defects contained within the layer of the intermediate comprise less than about 20 percent of any volume element of the intermediate defined by a projection of one square centimeter of a surface of the intermediate.
9 . The method of claim 1 , wherein the carboxylate salt of the transition metal comprises Cu(O 2 CC 2 H 5 ) 2 .
10 . The method of claim 9 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
11 . The method of claim 10 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium carboxylates and nonhalogenated yttrium carboxylates.
12 . The method of claim 1 , wherein the carboxylate salt of the transition metal comprises a nonhalogenated carboxylate salt.
13 . The method of claim 12 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
14 . The method of claim 13 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
15 . A method, comprising:
disposing a precursor solution onto a surface of a layer to form a precursor film, the precursor film including a salt of a rare earth metal, a salt of an alkaline earth metal and a carboxylate salt of copper; and treating the precursor film to form an intermediate of a rare earth metal-alkaline earth metal-transition metal oxide.
16 . The method of claim 15 , wherein the precursor film is treated for less than about five hours.
17 . The method of claim 15 , wherein the precursor solution further comprises a Lewis base.
18 . The method of claim 17 , wherein the Lewis base comprises a nitrogen-containing compound.
19 . The method of claim 18 , wherein the nitrogen-containing compound is selected from the group consisting of ammonia and amines.
20 . The method of claim 15 , wherein the layer of the intermediate has a thickness of at least about two micrometers.
21 . The method of claim 15 , wherein the layer of the intermediate has a thickness of at least about three micrometers.
22 . The method of claim 15 , wherein the layer of the intermediate has a thickness of at least about four micrometers.
23 . The method of claim 15 , wherein the layer of the intermediate has a thickness of at least about five micrometers.
24 . The method of claim 15 , further comprising treating the layer of the intermediate to form a layer of a rare earth metal-alkaline earth metal-transition metal oxide material having a critical current density of at least about 0.5×10 6 Amperes per square centimeter.
25 . The method of claim 15 , wherein defects contained within the layer of the intermediate comprise less than about 20 percent of any volume element of the intermediate defined by a projection of one square centimeter of a surface of the intermediate.
26 . The method of claim 15 , wherein the carboxylate salt of copper comprises Cu(O 2 CC 2 H 5 ) 2 .
27 . The method of claim 26 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
28 . The method of claim 27 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
29 . The method of claim 15 , wherein the carboxylate salt of copper comprises a nonhalogenated carboxylate salt of copper.
30 . The method of claim 29 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
31 . The method of claim 30 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
32 . A method, comprising:
disposing a precursor solution onto a surface of a layer to form a precursor film, the precursor film including a salt of a rare earth metal, a salt of an alkaline earth metal and a carboxylate salt of a transition metal; and treating the precursor film to form a rare earth metal-alkaline earth metal-transition metal oxide intermediate.
33 . The method of claim 32 , wherein the precursor film is treated for less than about five hours.
34 . The method of claim 32 , wherein the precursor solution further comprises a Lewis base.
35 . The method of claim 32 , wherein the Lewis base comprises a nitrogen-containing compound.
36 . The method of claim 32 , wherein the nitrogen-containing compound is selected from the group consisting of ammonia and amines.
37 . The method of claim 32 , wherein the superconductor material has a critical current density of at least about 1×10 6 Amperes per square centimeter.
38 . The method of claim 32 , wherein the intermediate is at least about one micrometer thick.
39 . The method of claim 32 , wherein the carboxylate salt of the transition metal comprises Cu(O 2 CC 2 H 5 ) 2 .
40 . The method of claim 39 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
41 . The method of claim 40 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
42 . The method of claim 32 , wherein the carboxylate salt of the transition metal comprises a nonhalogenated carboxylate salt.
43 . The method of claim 42 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
44 . The method of claim 43 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
45 . A composition, comprising:
a salt of a rare earth metal; a salt of an alkaline earth metal; and a carboxylate salt of copper.
46 . The composition of claim 45 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
47 . The composition of claim 46 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
48 . The composition of claim 45 , further comprising a Lewis base.
49 . The composition of claim 48 , wherein the alkaline earth metal salt comprises barium trifluoroacetate.
50 . The composition of claim 49 , wherein the rare earth metal salt comprises a salt selected from the group consisting of halogenated yttrium acetates and nonhalogenated yttrium acetates.
51 . A method, comprising:
disposing a precursor solution onto a surface of a layer to form a precursor film, the precursor film including a salt of a rare earth metal, a salt of an alkaline earth metal, a salt of a transition metal and a Lewis base; and treating the precursor film to form an intermediate of a rare earth metal-alkaline earth metal-transition metal oxide.
52 . The method of claim 51 , wherein the Lewis base comprises a nitrogen-containing compound.
53 . The method of claim 52 , wherein the nitrogen-containing compound is selected from the group consisting of ammonia and amines.
54 . The method of claim 52 , wherein the nitrogen-containing compound comprises an amine having a formula selected from the group consisting of CH 3 CN, C 5 H 5 N and R 1 R 2 R 3 N, wherein each of R 1 R 2 and R 3 are independently selected from the group consisting of H, a straight chained alkyl group, a branched alkyl group, an aliphatic alkyl group, a non-aliphatic alkyl group and a substituted alkyl group.
55 . The method of claim 51 , wherein the layer of the intermediate has a surface adjacent the surface of the first layer and the layer of the intermediate has a plurality of volume elements, and wherein defects contained within the intermediate comprise less than about 20 percent of any volume element of the intermediate defined by a projection of one square centimeter of the surface of the intermediate, and the intermediate is free of any defect having a maximum dimension greater than about 200 micrometers.
56 . The method of claim 51 , wherein the precursor film is treated for less than about five hours.
57 . The method of claim 51 , wherein the layer of the intermediate has a surface adjacent the surface of the first layer and the layer of the intermediate has a plurality of volume elements, and wherein defects contained within the intermediate comprise less than about 10 percent of any volume element of the intermediate defined by a projection of one square centimeter of the surface of the intermediate, and the intermediate is free of any defect having a maximum dimension greater than about 200 micrometers.
58 . The method of claim 51 , wherein the intermediate is capable of being processed to provide a superconductor material having a critical current density of at least about 0.5×10 6 Amperes per square centimeter.
59 . A composition, comprising:
a Lewis base; a salt of a rare earth metal; a salt of an alkaline earth metal; and a salt of a transition metal.
60 . The composition of claim 59 , wherein the Lewis base comprises a nitrogen-containing compound.
61 . The composition of claim 60 , wherein the nitrogen-containing compound is selected from the group consisting of ammonia and amines.
62 . The composition of claim 60 , wherein the nitrogen-containing compound comprises an amine having a formula selected from the group consisting of CH 3 CN, C 5 H 5 N and R 1 R 2 R 3 N, wherein each of R 1 , R 2 and R 3 are independently selected from the group consisting of H, a straight chained alkyl group, a branched alkyl group, an aliphatic alkyl group, a non-aliphatic alkyl group and a substituted alkyl group.
63 . The composition of claim 59 , wherein the transition metal salt has a formula selected from the group consisting of M (CXX X —CO(CH) a CO—CX X X )(CX X X —CO(CH) b CO—CX X X ), M (O 2 C—(CH 2 ) n —CXX X )(O 2 C—(CH 2 ) m —CX X X ) and M (OR) 2 , wherein M is the transition metal, a is an integer having a value of at least one and at most five, b is an integer having a value of at least one and at most five, n is an integer having a value of at least one and at most ten, m is an integer having a value of at least one and at most ten, R is a halogenated or nonhalogenated carbon containing group, and each of X, X , X , X , X , X , X , X , X , X , X , X is H, F, Cl, Br or I, with the proviso that the transition metal salt does not have the formula M (CF 3 CO 2 ) 2 .
64 . The composition of claim 59 , wherein the transition metal salt comprises a carboxylate salt.
65 . The composition of claim 59 , wherein the transition metal salt comprises Cu(C) 2 CC 2 H 5 ) 2 .
66 . The method of claim 1 , wherein the layer of the intermediate has a surface adjacent the surface of the first layer and the layer of the intermediate has a plurality of volume elements, and wherein defects contained within the intermediate comprise less than about 20 percent of any volume element of the intermediate defined by a projection of one square centimeter of the surface of the intermediate, and the intermediate is free of any defect having a maximum dimension greater than about 200 micrometers.
67 . The method of claim 15 , wherein the layer of the intermediate has a surface adjacent the surface of the first layer and the layer of the intermediate has a plurality of volume elements, and wherein defects contained within the intermediate comprise less than about 20 percent of any volume element of the intermediate defined by a projection of one square centimeter of the surface of the intermediate, and the intermediate is free of any defect having a maximum dimension greater than about 200 micrometers.
68 . The method of claim 67 , wherein the intermediate is capable of being processed to form a superconductor material having a critical current density of at least about 0.5×10 6 Amperes per square centimeter.
69 . A method, comprising:
disposing a precursor solution onto a surface of a layer to form a precursor film; and treating the precursor film to form a superconductor material having a critical current of at least about 200 Amperes per centimeter of width.
70 . The method of claim 69 , wherein the superconductor material has a critical current of at least about 300 Amperes per centimeter of width.
71 . The method of claim 69 , wherein the superconductor material has a critical current of at least about 300 Amperes per centimeter of width.
72 . The method of claim 69 , wherein the precursor solution comprises a salt of a rare earth metal, a salt of an alkaline earth metal and a salt of a transition metal.
73 . The method of claim 72 , wherein the rare earth metal is yttrium, the alkaline earth metal is barium, and the transition metal is copper.
74 . The method of claim 69 , wherein the superconductor material comprises a rare earth metal-alkaline earth metal-transition metal oxide.
75 . The method of claim 69 , wherein the superconductor material comprises YBCO.
76 . The method claim 69 , wherein the method includes forming an intermediate of the superconductor material.
77 . The method of claim 76 , wherein the intermediate is metal oxyfluoride intermediate.
78 . The method of claim 1 , wherein the intermediate of the rare earth metal-alkaline earth metal-transition metal is further treated to form a superconductor material has a critical current of at least about 200 Amperes per centimeter width.
79 . The method of claim 15 , wherein the intermediate of the rare earth metal-alkaline earth metal-transition metal is further treated to form a superconductor material has a critical current of at least about 200 Amperes per centimeter width.
80 . The method of claim 32 , wherein the intermediate of the rare earth metal-alkaline earth metal-transition metal is further treated to form a superconductor material has a critical current of at least about 200 Amperes per centimeter width.
81 . The method of claim 51 , wherein the intermediate of the rare earth metal-alkaline earth metal-transition metal is further treated to form a superconductor material has a critical current of at least about 200 Amperes per centimeter width.
82 . The method of claim 1 , wherein the carboxylate salt of the transition metal comprises a propionate salt of the transition metal.
83 . The method of claim 15 , wherein the carboxylate salt of the transition metal comprises a propionate salt of the transition metal.
84 . The method of claim 32 , wherein the carboxylate salt of the transition metal comprises a propionate salt of the transition metal.
85 . The composition of claim 45 , wherein the carboxylate salt of copper comprises a propionate salt of copper.
86 . The method of claim 51 , wherein the salt of the transition metal comprises a carboxylate salt of the transition metal.
87 . The composition of claim 59 , wherein the salt of the transition metal comprises a carboxylate salt of the transition metal.
88 . The composition of claim 69 , wherein the precursor solution comprises a Lewis base.Join the waitlist — get patent alerts
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