Optical observation device and method for observing articles at elevated temperatures

Abstract

An optical system for viewing hot objects is disclosed. The system projects electromagnetic radiation to the part surface and detects the reflected portion. Based on wavelength and/or modulation of the applied illumination, the surface characteristics of the part can be observed without interference from self-emitted radiation.

1 . An optical system for producing an image of the surface of an object, said object having a characteristic, temperature-dependent, dominant, self-emitted EMR spectrum, comprising: 
 an EMR source for projecting electromagnetic radiation toward said object;    an EMR detector for selectively detecting a spectrum component of said projected EMR, said component being reflected by the surface of said object and being directed toward said EMR detector;    wherein said reflected component of said projected EMR has a wavelength different than said self-emitted, dominant EMR spectrum such that the reflected component can be distinguished from said self-emitted EMR based on wavelength.    
     
     
         2 . An optical system for producing an image of the surface of an object, said object having a characteristic, temperature-dependent, dominant, self-emitted EMR spectrum, comprising: 
 an EMR source for projecting electromagnetic radiation toward said object;    an EMR detector configured to produce a video signal, said detector for selectively detecting a spectrum component of said projected EMR, said component being reflected by the surface of said object and being directed toward said EMR detector; and    a processing unit for processing said video signal, wherein said reflected component of said projected EMR has a wavelength different than said self-emitted, dominant EMR spectrum such that the reflected component can be distinguished from said self-emitted EMR based on wavelength.    
     
     
         3 . The system of  claim 2  wherein said processing unit is configured to determine dimensional measurements of said object.  
     
     
         4 . The system of  claim 3  wherein said processing unit is configured to determine one or more defects of said object.  
     
     
         5 . The system of  claim 2  wherein said video signal is provided to a display so as to allow an operator to process the video signal.  
     
     
         6 . The system of  claim 2  wherein said processing unit comprises an automatic computing device selected from the group comprising of a central processing unit (CPU), a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) and a combination thereof.  
     
     
         7 . The system of  claim 3  wherein said object comprises a fabricated metal part.  
     
     
         8 . The system of  claim 7  wherein said metal part is fabricated by a deforming process.  
     
     
         9 . The system of  claim 7  wherein said metal part is fabricated by a heat treatment process.  
     
     
         10 . The system of  claim 4 , wherein said object comprises a fabricated metal part.  
     
     
         11 . The system of  claim 10  wherein said metal part is fabricated by a deforming process.  
     
     
         12 . The system of  claim 10  wherein said metal part is fabricated by a heat treatment process.  
     
     
         13 . The system of  claim 3  wherein said object comprises a fabricated glass part.  
     
     
         14 . The system of  claim 4  wherein said object comprises a fabricated glass part.  
     
     
         15 . The system of  claim 3  wherein said object comprises a fabricated ceramic part.  
     
     
         16 . The system of  claim 4  wherein said object comprises a fabricated ceramic part.  
     
     
         17 . The system of  claim 7  wherein said metal part is subjected to one of forging and rolling.  
     
     
         18 . An optical system for producing an image of the surface of a hot object, said object having a characteristic, dominant, self-emitted EMR spectrum, comprising: 
 a video camera configured to produce a video signal;    an interference filter in association with said video camera for blocking substantially all of said self-emitted EMR spectrum;    a light source attached to said video camera; and    a processing unit responsive to said video signal for one of determining dimensional measurements of said object and detecting one or more defects of said object.