Arrangement for spectrally sensitive reflected-light and transmitted-light microscopy

Abstract

The arrangement for spectrally sensitive reflected-light and transmitted-light microscopy comprises an illuminating device which illuminates a sample under study in two dimensions. A scanning device is provided which respectively directs the light emanating from a detection region of the sample under study onto a multiband detector. In one embodiment, the illuminating device is arranged in such a way that it transilluminates the sample in two dimensions. In a further embodiment, the illuminating device illuminates the sample in two dimensions in reflected light.

What is claimed is:  
     
         1 . Arrangement for spectrally sensitive reflected-light and transmitted-light spectroscopy, comprising an illuminating device ( 1 ) for illuminating at least one region of a sample ( 4 ) in two dimensions, a scanning device ( 6 ) which defines a detection region in the sample and a multiband detector ( 7 ) which receives the light emanating from the detection region of the sample in temporal sequence wherein the light is directed by the scanning device ( 6 ).  
     
     
         2 . The arrangement according to  claim 1 , characterized in that the illuminating device ( 1 ) transilluminates the sample ( 4 ) in two dimensions.  
     
     
         3 . The arrangement according to  claim 1 , characterized in that the illuminating device ( 1 ) illuminates the sample ( 4 ) in two dimensions in reflected light.  
     
     
         4 . The arrangement according to  claim 1 , characterized in that a pinhole is provided upstream of the multiband detector ( 7 ), the detection region being smaller than the pinhole.  
     
     
         5 . The arrangement according to  claim 2 , characterized in that the multiband detector ( 7 ) records at least two data records of the sample ( 4 ) of different spectral compositions.  
     
     
         6 . The arrangement according to  claim 5 , characterized in that the multiband detector ( 7 ) constitutes a slit/detector arrangement.  
     
     
         7 . The arrangement according to  claim 5 , characterized in that the multiband detector ( 7 ) is formed by at least one dichroic beam splitter ( 9 ,  10 ) which directs the light onto an assigned detector ( 11 ,  12 ,  13 ) in accordance with the filter properties.  
     
     
         8 . The arrangement according to  claim 1 , characterized in that the scanning device ( 6 ) rasterizes the region of the sample ( 4 ) in such a way that the light from the plurality of detection regions, which are substantially smaller than the region of the sample ( 4 ), passes into the multiband detector ( 7 ) sequentially.