Measurement system for analysing radio frequency signals, and method of operating the same
Abstract
Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting preferably coherent light onto the reflective planar face, and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.
Claims
exact text as granted — not AI-modifiedThe invention claimed is:
1. A measurement system for analysing RF signals, comprising
an optically transparent enclosure comprising an optically pumpable gas;
a printed circuit board, PCB, comprising an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face;
an optical pump for emitting preferably coherent light onto the reflective planar face; and
a detector for detecting an optical property of the emitted light being reflected by the reflective planar face.
2. The measurement system of claim 1 ,
the gas comprising an alkali metal, preferably Rubidium.
3. The measurement system of claim 1 ,
the transmission line comprising an insulator layer sandwiched between conductor layers.
4. The measurement system of claim 3 ,
the transmission line including one of:
a microstrip; and
a coplanar waveguide with ground.
5. The measurement system of claim 1 ,
the PCB including one of:
a reflective coating; and
a polished conductor layer.
6. The measurement system of claim 5 ,
the reflective coating comprising one of:
a reflective dielectric coating comprising a quarterwave stack of alternating high and low index layers; and
a reflective metal coating.
7. The measurement system of claim 1 ,
the reflective planar face of the PCB having a reflectance for the emitted light in excess of 80%.
8. The measurement system of claim 1 ,
the emitted light having a wavelength in accordance with an energy transition of the gas, preferably 780 nm or 795 nm.
9. The measurement system of claim 1 ,
the optical pump arranged to emit the light in a continuous wave, CW, mode or in a pulsed mode.
10. The measurement system of claim 1 ,
the optical pump arranged to emit the light perpendicularly to a propagation direction of the RF signal.
11. The measurement system of claim 1 ,
propagation directions of the emitted light and the reflected light forming an intermediate angle of at most 174°, preferably at most 160°, more preferably at most 140°, and most preferably 90°.
12. The measurement system of claim 11 ,
the detector and the optical pump arranged non-coaxially in accordance with the intermediate angle.
13. The measurement system of claim 1 ,
the detector comprising one of:
a photodiode; and
a camera.
14. The measurement system of claim 1 ,
the PCB comprising two electrical transmission lines on respective reflective planar faces of the PCB; and
the measurement system comprising
two optical pumps for emitting light in accordance with an energy transition of the gas; and
two detectors for detecting an optical property of the emitted light emitted by the respective optical pump and reflected by the respective reflective planar face.
15. A method of operating a measurement system for analysing RF signals,
the measurement system comprising
a optically transparent enclosure comprising an optically pumpable gas;
a printed circuit board, PCB, comprising an electrical transmission line and a reflective planar face;
an optical pump; and
a detector;
the method comprising
guiding the RF signal to be analyzed through the enclosure via the transmission line;
emitting coherent light onto the reflective planar face; and
detecting an optical property of the emitted light being reflected by the reflective planar face.Join the waitlist — get patent alerts
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