Sensitive detection of low doses of beta particles using quartz crystal oscillators

Abstract

A method of determining beta radiation intensity based on calculated resonance frequency and calculated quality factor can include providing an electrical sensor comprising at least one prong, irradiating the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation from a beta radiation source; measuring at least one impedance value from the electrical sensor with an impedance analyzer; calculating at least one resonance frequency value based on the measured at least one impedance value; calculating at least one quality factor value based on the calculated at least one resonance frequency value; and determining the beta radiation intensity based on the calculated at least one resonance frequency value and the calculated at least one quality factor value.

We claim: 
     
       1. A system comprising:
 an electrical sensor comprising at least one prong and a cylindrical substrate, the at least one prong comprising a first section and a second section, the first section comprising a plurality of planar surfaces, each of the plurality of planar surfaces having a first end and a second end, the first end of each of the plurality of planar surfaces being connected to the cylindrical substrate, and the second end of each of the plurality of planar surfaces being connected to the second section, wherein each of the plurality of planar surfaces comprises a first material, one of the plurality of planar surfaces is coated with a second material to form a first composite material, and wherein the first composite material is different from a material of the second section; 
 a beta radiation source configured to irradiate the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation; 
 an impedance analyzer configured to measure at least one impedance value from the electrical sensor; and 
 a data acquisition device configured to:
 calculate at least one resonance frequency value based on the measured at least one impedance value; and 
 calculate at least one quality factor value based on the calculated at least one resonance frequency value. 
 
 
     
     
       2. The system of  claim 1 , wherein the electrical sensor comprises a quartz tuning fork. 
     
     
       3. The system of  claim 1 , wherein the first material and the second material comprise quartz and silver, respectively. 
     
     
       4. The system of  claim 1 , wherein the material of the second section comprises the first material. 
     
     
       5. The system of  claim 1 , wherein the material of the second section comprises the first material, which is coated with a third material to form a second composite material. 
     
     
       6. The system of  claim 5 , wherein the third material comprises an aluminum film. 
     
     
       7. The system of  claim 1 , wherein the beta radiation source comprises a strontium-90 beta radiation source. 
     
     
       8. A method of determining an intensity of beta radiation based on a calculated resonance frequency and a calculated quality factor comprising:
 providing an electrical sensor comprising at least one prong and a cylindrical substrate, the at least one prong comprising a first section and a second section, the first section comprising a plurality of planar surfaces, each of the plurality of planar surfaces having a first end and a second end, the first end of each of the plurality of planar surfaces being connected to the cylindrical substrate, and the second end of each of the plurality of planar surfaces being connected to the second section, wherein each of the plurality of planar surfaces comprises a first material, one of the plurality of planar surfaces is coated with a second material to form a first composite material, and wherein the first composite material is different from a material of the second section; 
 irradiating the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation from a beta radiation source; 
 measuring at least one impedance value from the electrical sensor with an impedance analyzer; 
 calculating at least one resonance frequency value based on the measured at least one impedance value; 
 calculating at least one quality factor value based on the calculated at least one resonance frequency value; and 
 determining the intensity of beta radiation based on the calculated at least one resonance frequency value and the calculated at least one quality factor value. 
 
     
     
       9. The method of  claim 8 , wherein the first material and the second material comprise quartz and silver, respectively. 
     
     
       10. The method of  claim 8 , wherein the material of the second section comprises the first material. 
     
     
       11. The method of  claim 10 , wherein the at least one resonance frequency value comprises a range of about 32.9567 kHz to about 32.9922 kHz. 
     
     
       12. The method of  claim 8 , wherein the material of the second section comprises the first material, which is coated with a third material to form a second composite material. 
     
     
       13. The method of  claim 12 , wherein the third material comprises an aluminum film. 
     
     
       14. The method of  claim 13 , wherein the at least one resonance frequency value comprises a range of about 32.9567 kHz to about 33.0162 kHz. 
     
     
       15. The method of  claim 8 , wherein the beta radiation source comprises a strontium-90 beta radiation source.