Semiconductor package including test pad and bonding pad structure for die connection and methods for forming the same

Abstract

A semiconductor package structure includes a first die, a second die disposed on the first die, and a bonding pad structure. The first die includes a semiconductor substrate, an interconnect structure disposed on the first semiconductor substrate, a passivation layer disposed on the interconnect structure, and a test pad disposed on the passivation layer. The test pad includes a contact region that extends through the passivation layer and electrically contacts the interconnect structure, and a bonding recess that overlaps with the contact region in a vertical direction perpendicular to a plane of the first semiconductor substrate. The bonding pad structure electrically connects the first die and the second die and directly contacts at least a portion of the bonding recess.

What is claimed is: 
     
       1. A semiconductor package comprising a first die comprising:
 a first semiconductor substrate; 
 a first interconnect structure disposed on the first semiconductor substrate; 
 a first passivation layer disposed on the first interconnect structure; and 
 a test pad disposed on the first passivation layer, the test pad comprising:
 a contact region that extends through the first passivation layer and electrically contacts the first interconnect structure, and 
 a bonding recess that overlaps with the contact region in a vertical direction perpendicular to a plane of the first semiconductor substrate, 
 
 wherein the bonding recess is configured to receive a bonding pad structure that is configured to electrically connect the first die to another die. 
 
     
     
       2. The semiconductor package of  claim 1 , further comprising:
 a second die stacked on the first die in the vertical direction; and 
 the bonding pad structure electrically connecting the first die and the second die and directly contacting at least a portion of the bonding recess. 
 
     
     
       3. The semiconductor package of  claim 2 , wherein the bonding pad structure directly contacts from 0.1% to 100% of the bonding recess. 
     
     
       4. The semiconductor package of  claim 2 , wherein the bonding pad structure directly contacts from 50% to 100% of the bonding recess. 
     
     
       5. The semiconductor package of  claim 2 , wherein the bonding pad structure comprises:
 a bonding via structure that directly contacts the bonding recess; and 
 a bonding pad that is disposed on the bonding via structure and is electrically connected to the second die. 
 
     
     
       6. The semiconductor package of  claim 5 , further comprising a die bonding structure comprising:
 a first bonding layer that covers the first die; and 
 a second bonding layer that covers the second die and is bonded to the first bonding layer. 
 
     
     
       7. The semiconductor package of  claim 6 , wherein:
 the bonding via structure extends through the first bonding layer and an interconnect planarization layer; and 
 the bonding pad extends through the second bonding layer and contacts a second interconnect structure of the second die. 
 
     
     
       8. The semiconductor package of  claim 6 , wherein the test pad comprises:
 a landing region disposed on the first passivation layer, over the contact region, the landing region comprising the bonding recess; 
 a test region disposed on the first passivation layer and extending from the landing region; and 
 the test region is wider than the landing region and is configured to contact a test probe. 
 
     
     
       9. The semiconductor package of  claim 2 , wherein:
 the test pad is formed of a material having a higher electrical resistance than a material used to form the bonding pad structure; and 
 the bonding recess has a concave surface and is configured to decrease electrical contact resistance between the test pad and the bonding pad structure. 
 
     
     
       10. A semiconductor package comprising a first die comprising:
 a first semiconductor substrate; 
 a first interconnect structure disposed on the first semiconductor substrate; 
 a first passivation layer disposed on the first interconnect structure; 
 a first test pad disposed on the first passivation layer, the first test pad comprising:
 a first contact region that extends through the first passivation layer and electrically contacts the first interconnect structure; and 
 a first bonding recess that overlaps with the first contact region in a vertical direction perpendicular to a plane of the first semiconductor substrate; and 
 
 a bonding pad structure directly contacting at least a portion of the first bonding recess, the bonding pad structure configured to electrically connect the first die to another die. 
 
     
     
       11. The semiconductor package of  claim 10 , wherein the bonding pad structure directly contacts from 0.1% to 100% of the first bonding recess. 
     
     
       12. The semiconductor package of  claim 10 , further comprising a second die stacked on the first die in the vertical direction, the second die comprising:
 a second semiconductor substrate; 
 a second interconnect structure disposed on the second semiconductor substrate; 
 a second passivation layer disposed on the second interconnect structure; and 
 a second test pad disposed on the second passivation layer, the second test pad comprising a second contact region that extends through the second passivation layer and electrically contacts the second interconnect structure, and a second bonding recess that overlaps with the second contact region in the vertical direction. 
 
     
     
       13. The semiconductor package of  claim 12 , wherein the bonding pad structure directly contacts from 0.1% to 100% of a surface of the second bonding recess. 
     
     
       14. The semiconductor package of  claim 12 , wherein the bonding pad structure comprises:
 a first bonding via structure that directly contacts the first bonding recess; 
 a second bonding via structure that directly contacts the second bonding recess; and 
 a bonding pad that connects the first bonding via structure and the second bonding via structure. 
 
     
     
       15. The semiconductor package of  claim 14 , further comprising a die bonding structure comprising a first bonding layer bonded to the first die and a second bonding layer bonded to the second die and the first bonding layer,
 wherein the bonding pad comprises:
 a first metal layer formed in the first bonding layer and bonded to the first bonding via structure; and 
 a second metal layer formed in the second bonding layer and bonded to the second bonding via structure and the first metal layer. 
 
 
     
     
       16. The semiconductor package of  claim 12 , wherein:
 the first die and the second die are face-to-face bonded; and 
 the first test pad and the second test pad are formed of a material having a higher electrical resistance than a material used to form the bonding pad structure. 
 
     
     
       17. A method of forming a semiconductor package, comprising:
 forming a first test pad on a first passivation layer of a first die and in a first trench, such that the first test pad comprises a first bonding recess disposed above the first trench; 
 forming a first planarization layer on the first test pad and forming a first bonding layer on the first planarization layer; 
 forming a second trench in the first bonding layer and the first planarization layer to expose the first bonding recess; and 
 forming a bonding via structure in the second trench, such that the bonding via structure directly contacts at least a portion of the first bonding recess. 
 
     
     
       18. The method of  claim 17 , wherein the bonding via structure directly contacts from 0.1% to 100% of the first bonding recess. 
     
     
       19. The method of  claim 17 , further comprising bonding a second die to the first die, such that a second bonding layer disposed on the second die is bonded to the first bonding layer and a bonding pad of the second die is bonded to the bonding via structure to form a bonding pad structure that electrically connects the first die and the second die. 
     
     
       20. The method of  claim 19 , wherein:
 bonding the first die to the second die comprises face-to-face bonding; and 
 forming the first test pad comprises forming the first test pad of a material having a higher electrical resistance than a material used to form the bonding pad structure.