Image processing apparatus, image processing method, and non-transitory computer-readable storage medium

Abstract

A detection sensitivity is set such that a detection sensitivity for a defect corresponding to a predetermined local pattern in a reference image, which is a reference printing result, is lower than for a region other than the predetermined local pattern in the reference image. Image data representing an image of an inspection target is acquired and the image of the inspection target is inspected based on the reference image and the set detection sensitivity.

What is claimed is: 
     
       1. An image processing apparatus comprising:
 one or more memories configured to store instructions; and
 one or more processors configured to execute the stored instructions to function as: 
 a first acquisition unit configured to acquire an inspection target image; 
 a second acquisition unit configured to acquire a first inspection sensitivity for a defect that a user specifies; and 
 
 an inspection unit configured to inspect, with a second inspection sensitivity lower than the first inspection sensitivity, a first region which corresponds to a specific pattern similar to the defect in the inspection target image, and inspect, with the first inspection sensitivity, a second region which does not corresponds to the specific pattern in the inspection target image. 
 
     
     
       2. The apparatus according to  claim 1 , wherein the inspection unit is configured to inspect the inspection target mage using a reference image which is an inspection reference. 
     
     
       3. The image according to  claim 1 , wherein the one or more processors are further configured to cause the image processing apparatus to function as an extraction unit configured to extract a region which corresponds to the specific pattern in a reference image which is an inspection reference, and
 the first region is set based on the extracted region. 
 
     
     
       4. The apparatus according to  claim 3 , wherein the extraction unit is configured to extract, using a filter for enhancing the specific pattern, the region which corresponds to the specific pattern in the reference image. 
     
     
       5. The apparatus according to  claim 1 , wherein the inspection unit is configured to inspect the inspection target image using a threshold and a pixel value of a difference image which indicates difference between the inspection target image and a reference image which is an inspection reference. 
     
     
       6. The apparatus according to  claim 5 , wherein the inspection unit sets the threshold so that the higher the inspection sensitivity is, the smaller the value of the threshold is. 
     
     
       7. The apparatus according to  claim 1 , wherein the specific pattern is a line-like pattern and a defect similar to the line-like pattern is a line-like defect. 
     
     
       8. The apparatus according to  claim 1 , wherein the specific pattern is a point-like pattern and a defect similar to the point-like pattern is a point-like defect. 
     
     
       9. The apparatus according to  claim 1 , wherein the one or more processors are further configured to cause the image processing apparatus to function as:
 a print unit configured to print based on a document; and 
 a reading unit configured to read a print product obtained by the print, 
 wherein the inspection target image is obtained by reading the print product. 
 
     
     
       10. The apparatus according to  claim 9 , wherein a print product having passed the inspection by the inspection unit is output to a first tray, and a print product having failed the inspection by the inspection unit is output to a second tray different from the first tray. 
     
     
       11. The apparatus according to  claim 1 , wherein the inspection unit inspects the first region with the second inspection sensitivity that a user does not specify. 
     
     
       12. The apparatus according to  claim 1 , wherein the one or more processors are further configured to cause the image processing apparatus to function as a display control unit configured to display a user interface used for specify an inspection sensitivity for each of a plurality types of defects. 
     
     
       13. The apparatus according to  claim 1 , wherein the one or more processors are further configured to cause the image processing apparatus to function as a display control unit configured to display a user interface used for specify an inspection sensitivity for a line-like defect and an inspection sensitivity for a point-like defect. 
     
     
       14. The apparatus according to  claim 1 , wherein the second acquisition unit is configured to acquire the first inspection sensitivity for a line-like defect that a user specifies and a third inspection sensitivity for a point-like defect that the user specifies, and the inspection unit is configured to inspect, with the second inspection sensitivity and the third inspection sensitivity, the first region which corresponds to the line-like pattern in the inspection target image, and inspect the second region with the first inspection sensitivity and the third inspection sensitivity. 
     
     
       15. The apparatus according to  claim 1 , wherein the second acquisition unit is configured to acquire the first inspection sensitivity for a line-like defect that a user specifies and a third inspection sensitivity for a point-like defect that the user specifies, and
 the inspection unit is configured to inspect, with the second inspection sensitivity, the first region which corresponds to the line-like pattern in the inspection target image, inspect the second region with the first inspection sensitivity, inspect, with a fourth inspection sensitivity lower than the third inspection sensitivity, a third region which corresponds to the point-like pattern in the inspection target image, and inspect, with the third inspection sensitivity, a fourth region which does not correspond to the point-like pattern in the inspection target image. 
 
     
     
       16. An image processing method comprising:
 acquiring an inspection target image; 
 acquiring a first inspection sensitivity for a defect that a user specifies; and 
 inspecting, with a second inspection sensitivity lower than the first inspection sensitivity, a first region which corresponds to a specific pattern similar to the defect in the inspection target image, and inspect, with the first inspection sensitivity, a second region which does not corresponds to the specific pattern in the inspection target image. 
 
     
     
       17. A non-transitory computer-readable storage medium storing instructions that, when executed by a computer, cause the computer to perform a method comprising:
 acquiring an inspection target image; 
 acquiring a first inspection sensitivity for a defect that a user specifies; and 
 inspecting, with a second inspection sensitivity lower than the first inspection sensitivity, a first region which corresponds to a specific pattern similar to the defect in the inspection target image, and inspect, with the first inspection sensitivity, a second region which does not corresponds to the specific pattern in the inspection target image.