Single-crystal X-ray structure analysis apparatus and sample holder attaching device

Abstract

A single-crystal X-ray structure analysis apparatus capable of surely and easily performing operations of removing/attaching a sample soaked in a crystalline sponge from/to the apparatus, and a sample holder attaching device thereof, are provided. There are provided a sample holder attaching device comprising a sample holder attaching mechanism 600 that attaches the sample holder 250 to a goniometer 12 in the single-crystal X-ray structure analysis apparatus in a state where the sample holder 250 is removed from the applicator 300 ; wherein the sample holder 250 comprises a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein, and the porous complex crystal is fixed at a position of the sample holder 250 to which X-rays are irradiated from an X-ray irradiation section, in a state where the sample holder 250 is attached to the goniometer 12.

The invention claimed is: 
     
       1. A sample holder attaching device that attaches a sample holder that holds a sample into a single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the sample holder attaching device comprising:
 a sample holder attaching mechanism that attaches the sample holder provided and attached to an attachable/detachable applicator, to a goniometer in the single-crystal X-ray structure analysis apparatus in a state where the sample holder is removed from the applicator, wherein 
 the sample holder comprises a base part that is detachably attached to the tip portion of the goniometer and a holding part to which a porous complex crystal capable of soaking the sample in a plurality of fine pores formed therein can be attached, 
 the holding part is formed on the base part, 
 the applicator has a storing space for storing the sample holder, and 
 the sample holder attaching mechanism has a sample holder support section that enable removing the sample holder from the applicator and attaching the sample holder to the goniometer, and 
 the porous complex crystal is fixed at a position of the sample holder, where X-rays are irradiated from an X-ray irradiation section, in a state where the sample holder is attached to the goniometer. 
 
     
     
       2. The sample holder attaching device according to  claim 1 ,
 wherein the sample holder attaching mechanism comprising: 
 an applicator support section that supports the applicator; and 
 wherein at least one of the sample holder support section and the applicator support section is movable in a direction of removing the sample holder from the applicator supported by the applicator support section, in a state where the sample holder is supported by the sample support section. 
 
     
     
       3. The sample holder attaching device according to  claim 2 ,
 wherein the sample holder support section is movable in an extending direction of a pin-shaped holding part to which the porous complex crystal of the sample holder is attached. 
 
     
     
       4. The sample holder attaching device according to  claim 2 ,
 wherein the sample holder support section is rotationally movable in the state where the sample holder is supported and can attach the sample holder to the goniometer with the sample holder flipped upside down from the state in which the sample holder is stored in the applicator. 
 
     
     
       5. The sample holder attaching device according to  claim 2 ,
 wherein the sample holder support section is movable in a direction of attaching the sample holder to a sample holder attachment position of the goniometer, in the state where the sample holder is supported. 
 
     
     
       6. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 1 . 
 
     
     
       7. The sample holder attaching device according to  claim 3 ,
 wherein the sample holder support section is rotationally movable in the state where the sample holder is supported. 
 
     
     
       8. The sample holder attaching device according to  claim 3 ,
 wherein the sample holder support section is movable in a direction of attaching the sample holder to a sample holder attachment position of the goniometer, in the state where the sample holder is supported. 
 
     
     
       9. The sample holder attaching device according to  claim 4 ,
 wherein the sample holder support section is movable in a direction of attaching the sample holder to a sample holder attachment position of the goniometer, in the state where the sample holder is supported. 
 
     
     
       10. The sample holder attaching device according to  claim 7 ,
 wherein the sample holder support section is movable in a direction of attaching the sample holder to a sample holder attachment position of the goniometer, in the state where the sample holder is supported. 
 
     
     
       11. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 2 . 
 
     
     
       12. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 3 . 
 
     
     
       13. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 4 . 
 
     
     
       14. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 5 . 
 
     
     
       15. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 7 . 
 
     
     
       16. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 8 . 
 
     
     
       17. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 9 . 
 
     
     
       18. A single-crystal X-ray structure analysis apparatus that performs a structure analysis of a material, the apparatus comprising:
 an X-ray source that generates X-rays; 
 a sample holder that holds a sample; 
 a goniometer that rotationally moves with the sample holder being attached thereto; 
 an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; 
 an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; 
 a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays detected by the X-ray detection measurement section; and 
 the sample holder attaching device according to  claim 10 . 
 
     
     
       19. The sample holder attaching device according to  claim 1 , wherein
 the sample holder support section can hold/release the base part and hold the outer periphery of the base part for removal from the applicator and attachment to the goniometer. 
 
     
     
       20. The sample holder attaching device according to  claim 2 , wherein
 the sample holder support section can hold/release the base part and hold the outer periphery of the base part for removal from the applicator and attachment to the goniometer.