Photonic band-gap resonator for magnetic resonance applications
Abstract
Aspects of photonic band gap resonators for magnetic resonance are described. In one example, an apparatus includes a 1D structure having a plurality of layers. A respective thickness of the individual layers is one-quarter of a respective wavelength of a target magnetic resonance frequency within the individual layers of the plurality of layers, or a multiple thereof. A first layer has a first dielectric constant, and a second layer that is adjacent to the first layer has a second dielectric constant. A defect includes a sample. The defect has a thickness that is approximately up to one-half of a wavelength of the target magnetic resonance frequency within the defect.
Claims
exact text as granted — not AI-modifiedTherefore, the following is claimed:
1. A resonator, comprising:
a periodic 1D structure comprising a plurality of dielectric layers, where individual layers of the plurality of dielectric layers each have a respective thickness that is one-quarter of a respective wavelength of a target magnetic resonance frequency within that individual layer or a multiple thereof;
a first layer of the plurality of dielectric layers having a first dielectric constant;
a second layer of the plurality of dielectric layers that is adjacent to the first layer, the second layer having a second dielectric constant, wherein the first dielectric constant and the second dielectric constant are different;
a defect comprising a sample for testing, a defect thickness being up to multiples of one-half of a wavelength of the target magnetic resonance frequency within the defect; and
an electromagnetic coil that generates an electromagnetic field.
2. The resonator of claim 1 , further comprising a reflective surface.
3. The resonator of claim 2 , wherein the defect is adjacent to the reflective surface.
4. The resonator of claim 2 , further comprising a movable plunger, wherein the reflective surface is attached to the movable plunger, the defect is attached to the reflective surface, and an adjustment of the movable plunger tunes the resonator.
5. The resonator of claim 1 , wherein the sample comprises a liquid confined between at least two layers of the defect.
6. The resonator of claim 1 , wherein the defect comprises a porous material that is impregnated with the sample for testing.
7. The resonator of claim 1 , wherein the periodic 1D structure is formed within a cylinder having reflective surfaces.
8. A resonator, comprising:
a periodic 1D structure comprising a plurality of layers, where individual layers of the plurality of layers each have a respective thickness that is one-quarter of a respective wavelength of a target magnetic resonance frequency within that individual layer or a multiple thereof;
a first layer of the plurality of layers having a first dielectric constant;
a second layer of the plurality of layers that is adjacent to the first layer, the second layer having a second dielectric constant, wherein the first dielectric constant and the second dielectric constant are different; and
a defect comprising a sample, a defect thickness being up to a multiple of one-half of a wavelength of the target magnetic resonance frequency within the defect.
9. The resonator of claim 8 , further comprising a reflective surface, wherein the reflective surface is curved.
10. The resonator of claim 9 , wherein the defect is adjacent to the reflective surface.
11. The resonator of claim 8 , wherein the sample comprises a liquid confined between at least two layers of the defect.
12. The resonator of claim 8 , wherein the defect comprises a porous material, and the sample is held within the porous material.
13. The resonator of claim 8 , wherein the periodic 1D structure is formed within a cylinder having reflective surfaces.
14. An apparatus, comprising:
a 1D periodic structure comprising a plurality of layers, where individual layers of the plurality of layers each have a thickness that is one-quarter of a respective wavelength of a target magnetic resonance frequency within that individual layer or a multiple thereof;
a first layer of the plurality of layers having a first dielectric constant;
a second layer of the plurality of layers that is adjacent to the first layer, the second layer having a second dielectric constant, wherein the first dielectric constant and the second dielectric constant are different; and
a defect comprising a sample, a defect thickness being up to a multiple of one-half of a wavelength of the target magnetic resonance frequency within the defect.
15. The apparatus of claim 14 , further comprising a reflective surface.
16. The apparatus of claim 14 , wherein the defect comprises a liquid confined between at least two layers of the defect.
17. The apparatus of claim 14 , wherein the defect comprises a porous material that is impregnated with the sample for testing.
18. The apparatus of claim 14 , wherein the target magnetic resonance frequency is 2 GHz or greater.
19. The apparatus of claim 14 , wherein incident power at the target magnetic resonance frequency is 100 mW or less.
20. The apparatus of claim 14 , wherein the 1D periodic structure is formed within a cylinder having reflective surfaces.Join the waitlist — get patent alerts
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