Recessed switched test connector

Abstract

Circuit boards incorporating one or more wireless communication components are often subjected to certification testing during commissioning. A test port is often included within each circuit board to perform the certification testing. The presently disclosed recessed test connectors reduce or eliminate protrusion of the test port on a non-component side of the circuit board, while still providing access to the test port from the non-component side of the circuit board.

What is claimed is: 
     
       1. A printed circuit board comprising:
 a substrate including an aperture; 
 an array of components attached to a first side of the substrate; and 
 a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes:
 a test port accessible from a second side of the substrate; 
 a bracket securing the recessed switched test connector within the aperture; and 
 a contact to elastically deflect and electrically open an electrical path through the printed circuit board when an associated test probe is inserted into the test port. 
 
 
     
     
       2. The printed circuit board of  claim 1 , wherein the recessed switched test connector protrudes beyond the first side of the substrate. 
     
     
       3. The printed circuit board of  claim 2 , wherein the array of components protrudes beyond the first side of the substrate a magnitude greater than the recessed switched test connector protrudes beyond the first side of the substrate. 
     
     
       4. The printed circuit board of  claim 1 , wherein the recessed switched test connector is set back within the aperture on the second side of the substrate. 
     
     
       5. The printed circuit board of  claim 1 , wherein the electrical path through the printed circuit board is restored when the associated test probe is removed from the test port. 
     
     
       6. The printed circuit board of  claim 1 , wherein the test port includes a self-centering countersink for the test probe. 
     
     
       7. The printed circuit board of  claim 1 , wherein the second side of the substrate opposes the first side of the substrate. 
     
     
       8. The printed circuit board of  claim 1 , wherein the bracket serves as electrical ground for the recessed switched test connector. 
     
     
       9. The printed circuit board of  claim 1 , wherein the bracket is attached to the second side of the substrate. 
     
     
       10. The printed circuit board of  claim 1 , wherein the recessed switched test connector further comprises:
 a bottom plate crimped to the bracket, wherein the electrical path through the recessed switched test connector is compressively secured between the bottom plate and the bracket. 
 
     
     
       11. A method of using a recessed switched test connector in a printed circuit board comprising:
 inserting a test probe into a test port of the recessed switched test connector, the recessed switched test connector oriented within an aperture in a substrate, and the recessed switched test connector accessible from a side of the substrate opposite an array of components attached to the substrate, whereby a contact elastically deflects and electrically opens when the test probe is inserted into the test port; and 
 certification testing an electrical circuit connected from the recessed switched test connector to the test probe. 
 
     
     
       12. The method of  claim 11 , further comprising:
 removing the test probe from the test port of the recessed switched test connector following the certification testing of the electrical circuit. 
 
     
     
       13. The method of  claim 12 , wherein removing the test probe from the test port restores the electrical path through the printed circuit board and disconnects the test probe from the electrical circuit. 
     
     
       14. The method of  claim 11 , wherein inserting the test probe into the test port connects the test probe to the electrical circuit. 
     
     
       15. The method of  claim 11 , wherein the recessed switched test connector is recessed within the aperture on the side of the substrate opposite the array of printed circuit board components attached to the substrate. 
     
     
       16. The method of  claim 11 , wherein inserting the test probe into the test port further includes directly grounding the test probe to the recessed switched test connector. 
     
     
       17. A computing device comprising:
 a printed circuit board including:
 a substrate including an aperture; 
 an array of components attached to a first side of the substrate; 
 a recessed switched test connector oriented within the aperture, wherein the recessed switched test connector includes:
 a test port accessible from a second side of the substrate; and 
 a bracket securing the recessed switched test connector within the aperture; 
 
 
 a display residing in close proximity to the first side of the substrate; and 
 a case residing in close proximity to the second side of the substrate, wherein the case includes a test aperture axially aligned with the test port permitting access to the test port from outside the computing device. 
 
     
     
       18. The computing device of  claim 17 , further comprising:
 a test probe for selective insertion into the test port, wherein the test probe is connected to a coaxial cable, and wherein an impedance of the test probe substantially matches an impedance of the coaxial cable. 
 
     
     
       19. The computing device of  claim 17 , further comprising:
 a test probe for selective insertion into the test port, wherein the test probe is grounded directly to the recessed switched test connector when inserted into the test port.