Inventor · name-matched record
HIROKI IKEDA
3 granted patents·0 citations·filing 2025–2025
54Inventor score
Technology areasF28F
Files withADVANTEST TEST SOLUTIONS INC3
This identity is grouped by exact name match (no disambiguated inventor record was available for these filings) — it may combine same-named inventors.
Top patents by PatentIndex Score
3 records- 0185US12540968B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Feb 3, 2026·0 cites·30 claims
- 0285US12540967B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Feb 3, 2026·0 cites·30 claims
- 0385US12535522B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2025·Granted Jan 27, 2026·0 cites·30 claims
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Identity basis: exact name match across USPTO filings. How scoring works →