Inventor · disambiguated record
Yung Kim
Also filed as: KIM YUNG K · KIM YUNG P · KIM YUNG PIL
5 granted patents·8 pending applications·18 citations·filing 2004–2009
75Inventor score
Top patents by PatentIndex Score
13 records- 0170US7839006B2Semiconductor device and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2009·Granted Nov 23, 2010·5 cites·4 claims
- 0266US7785914B2Image sensor and method for manufacturing the sameDONGBU HITEK CO LTD·Filed 2007·Granted Aug 31, 2010·2 cites·20 claims
- 0358US7575980B2Semiconductor device and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 18, 2009·2 cites·4 claims
- 0454US7235453B2Method of fabricating MIM capacitorDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Jun 26, 2007·8 cites·20 claims
- 0544US2007161147A1Method of manufacturing CMOS image sensorDONGBU ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0643US2008054387A1Image Sensor and Method for Manufacturing the SameKIM YUNG PIL·Filed 2007·Application pending·0 cites
- 0742US7141852B2Semiconductor device and fabricating method thereofDONGBU ELECTRONICS CO LTD·Filed 2004·Granted Nov 28, 2006·1 cites·14 claims
- 0841US2005013925A1Immobilization methods for organic molecules telomers and polymers on solid substratesFiled 2004·Application pending·0 cites
- 0940US2007293014A1Method for forming metal-insulator-metal capacitor of semiconductor deviceDONGBU HITEK CO LTD·Filed 2007·Application pending·0 cites
- 1039US2007145599A1Metal-insulator-metal (MIM) capacitor and methods of manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1138US2007049005A1Method for forming dual damascene pattern in semiconductor manufacturing processDONGBU ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1238US2008023736A1Semiconductor Device and Method for Manufacturing the SameKIM YUNG PIL·Filed 2007·Application pending·0 cites
- 1336US2006141773A1Method of forming metal line in semiconductor deviceKIM YUNG P·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →