Inventor · disambiguated record
Yoko Tohyama
Also filed as: TOHYAMA YOKO
0 granted patents·6 pending applications·0 citations·filing 2004–2007
Top patents by PatentIndex Score
6 records- 0144US2005141764A1Pattern analysis method and pattern analysis apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 0243US2005273739A1Pattern analysis method, pattern analysis apparatus, yield calculation method and yield calculation apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Application pending·0 cites
- 0340US2006273371A1Evaluation semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 0434US2005073875A1Redundancy repaired yield calculation methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Application pending·0 cites
- 0512US2007114396A1Critical area calculation method and yield calculation methodTOHYAMA YOKO·Filed 2006·Application pending·0 cites
- 067US2007266358A1Yield calculation methodTOHYAMA YOKO·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →