Inventor · disambiguated record
Yoshihide Tasaki
Also filed as: TASAKI YOSHIHIDE
2 granted patents·6 citations·filing 2006–2009
48Inventor score
Technology areasH10D
Files withOKI SEMICONDUCTOR CO LTD2
Top patents by PatentIndex Score
2 records- 0167US7608900B2Semiconductor device and method of manufacturing and inspection thereofOKI SEMICONDUCTOR CO LTD·Filed 2006·Granted Oct 27, 2009·6 cites·14 claims
- 0241US7956430B2Semiconductor device including groove width variation portion for inspectionOKI SEMICONDUCTOR CO LTD·Filed 2009·Granted Jun 7, 2011·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →