Inventor · disambiguated record
Yoshiaki Sera
Also filed as: SERA YOSHIAKI
3 granted patents·29 citations·filing 1996–2006
67Inventor score
Top patents by PatentIndex Score
3 records- 0167US7024605B2Flip-flop and scan path circuitNEC ELECTRONICS CORP·Filed 2002·Granted Apr 4, 2006·21 cites·3 claims
- 0245US7752516B2Semiconductor device and scan test methodNEC ELECTRONICS CORP·Filed 2006·Granted Jul 6, 2010·1 cites·6 claims
- 0331US6146977AMethod of manufacturing a radiation-resistant semiconductor integrated circuitNEC CORP·Filed 1996·Granted Nov 14, 2000·7 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →