Inventor · disambiguated record

Yoon Cheol Lim

Also filed as: LIM YOON CHEOL

1 granted patent·0 citations·filing 2010–2010

7Inventor score

Technology areasH01F

Files withHAAM SEUNG JOO1

Top patents by PatentIndex Score

1 record

0128US8671769B2Device for measuring deformation of a structure and a method for measuring deformation of a structure using the sameHAAM SEUNG JOO·Filed 2010·Granted Mar 18, 2014·0 cites·13 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →