Inventor · disambiguated record
Yasuhiko Iguchi
Also filed as: IGUCHI YASUHIKO
3 granted patents·2 pending applications·2 citations·filing 2002–2007
54Inventor score
Top patents by PatentIndex Score
5 records- 0154US7035752B2Semiconductor test data analysis systemAGILENT TECHNOLOGIES INC·Filed 2005·Granted Apr 25, 2006·1 cites·3 claims
- 0241US7053897B2Data analysis method and apparatus thereforAGILENT TECHNOLOGIES INC·Filed 2003·Granted May 30, 2006·1 cites·14 claims
- 0328US2004001096A1Data analysis apparatusFiled 2003·Application pending·0 cites
- 0426US2007216435A1Apparatus of measuring characteristics of semiconductor devicesIGUCHI YASUHIKO·Filed 2007·Application pending·0 cites
- 0525US6898545B2Semiconductor test data analysis systemSANDIA TECHNOLOGIES INC·Filed 2002·Granted May 24, 2005·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →