Inventor · disambiguated record
Yannick Bidel
Also filed as: BIDEL YANNICK
4 granted patents·1 pending application·3 citations·filing 2012–2016
57Inventor score
Top patents by PatentIndex Score
5 records- 0163US9046368B2Measurement by means of atom interferometryONERA (OFF NAT AEROSPATIALE)·Filed 2012·Granted Jun 2, 2015·3 cites·14 claims
- 0235US2015090028A1Atom Interferometry Device for Differential Inertial MeasurementONERA (OFF NAT AEROSPATIALE)·Filed 2013·Application pending·0 cites
- 0330US10153610B2Laser source, and apparatus and method for simultaneously interacting with a plurality of atomic speciesONERA OFFICE NATIONAL DETUDES ET DE RECH AEROSPATIALES·Filed 2015·Granted Dec 11, 2018·0 cites·20 claims
- 0429US10178752B2Measurement by atomic interferometry with multiple species of atomsONERA OFFICE NATIONAL DETUDES ET DE RECH AEROSPATIALES·Filed 2016·Granted Jan 8, 2019·0 cites·20 claims
- 0523US10090073B2Measurement by means of atomic interferometry with multiple species of atomsONERA OFFICE NATIONAL DETUDES ET DE RECH AEROSPATIALES·Filed 2016·Granted Oct 2, 2018·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →