Inventor · disambiguated record
William R. Spernow
Also filed as: SPERNOW WILLIAM · SPERNOW WILLIAM R
5 granted patents·3 pending applications·22 citations·filing 2013–2019
77Inventor score
Technology areasG06F
Top patents by PatentIndex Score
8 records- 0191US9990497B2Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2015·Granted Jun 5, 2018·16 cites·8 claims
- 0285US10528738B2Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2018·Granted Jan 7, 2020·4 cites·12 claims
- 0381US11354414B2Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2019·Granted Jun 7, 2022·2 cites·25 claims
- 0460US10546129B2Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2018·Granted Jan 28, 2020·0 cites·12 claims
- 0554US9990498B2Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2015·Granted Jun 5, 2018·0 cites·8 claims
- 0652US2016063248A1Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2015·Application pending·0 cites
- 0752US2016063249A1Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointFORENSIC SCAN LLC·Filed 2015·Application pending·0 cites
- 0852US2014181975A1Method to scan a forensic image of a computer system with multiple malicious code detection engines simultaneously from a master control pointSPERNOW WILLIAM·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →