Inventor · disambiguated record
William W. Chism, Ii
Also filed as: CHISM II WILLIAM W
9 granted patents·1 pending application·77 citations·filing 2004–2022
86Inventor score
Top patents by PatentIndex Score
10 records- 0190US11940488B2Systems and methods for high precision optical characterization of carrier transport properties in semiconductor manufacturingXCALIPR CORP·Filed 2022·Granted Mar 26, 2024·3 cites·14 claims
- 0287US10921369B2High precision optical characterization of carrier transport properties in semiconductorsCHISM II WILLIAM W·Filed 2017·Granted Feb 16, 2021·4 cites·20 claims
- 0387US7759607B2Method of direct Coulomb explosion in laser ablation of semiconductor structuresOPTICAL ANALYTICS INC·Filed 2007·Granted Jul 20, 2010·22 cites·9 claims
- 0485US7391507B2Method of photo-reflectance characterization of strain and active dopant in semiconductor structuresXITRONIX CORP·Filed 2006·Granted Jun 24, 2008·18 cites·19 claims
- 0582US7239392B2Polarization modulation photoreflectance characterization of semiconductor electronic interfacesXITRONIX CORP·Filed 2005·Granted Jul 3, 2007·13 cites·32 claims
- 0678US8300227B2Method and apparatus of z-scan photoreflectance characterizationCHISM II WILLIAM W·Filed 2009·Granted Oct 30, 2012·7 cites·20 claims
- 0768US6963402B2Polarization modulation photoreflectance characterization of semiconductor quantum confined structuresCHISM II WILLIAM W·Filed 2004·Granted Nov 8, 2005·10 cites·26 claims
- 0863US11402429B2High precision optical characterization of carrier transport properties in semiconductorsXCALIPR CORP·Filed 2021·Granted Aug 2, 2022·0 cites·16 claims
- 0962US12281992B1Systems and methods for voltage contrast imaging using photoreflectance microscopyCHISM II WILLIAM W·Filed 2022·Granted Apr 22, 2025·0 cites·14 claims
- 1046US2012327420A1Method and apparatus of z-scan photoreflectance characterizationCHISM II WILLIAM W·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →