Inventor · disambiguated record

Wilhelmus Jacobus Baselmans

Also filed as: BASELMANS WILHELMUS JACOBUS

1 granted patent·1 pending application·0 citations·filing 2008–2018

13Inventor score

Technology areasG03F

Files withASML NETHERLANDS BV2

Top patents by PatentIndex Score

2 records

0143US10627551B2Inspection apparatus, lithographic apparatus and method of measuring a property of a substrateASML NETHERLANDS BV·Filed 2018·Granted Apr 21, 2020·0 cites·20 claims
0236US2010296072A1Inspection Apparatus, Lithographic Apparatus and Method of Measuring a Property of a SubstrateASML NETHERLANDS BV·Filed 2008·Application pending·0 cites

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →