Inventor · disambiguated record

Whan Nam-Koong

Also filed as: NAM-KOONG WHAN

1 granted patent·6 citations·filing 2004–2004

28Inventor score

Technology areasH10P

Files withSAMSUNG ELECTRONICS CO LTD1

Top patents by PatentIndex Score

1 record

0144US7075074B2Electron beam inspection apparatus and method for testing an operation state of an electron beam inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 11, 2006·6 cites·29 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →