Inventor · disambiguated record
Wan Yen Teoh
Also filed as: TEOH WAN YEN
6 granted patents·58 citations·filing 2004–2012
83Inventor score
Top patents by PatentIndex Score
6 records- 0189US7378836B2Automated loading/unloading of devices for burn-in testingSPANSION LLC·Filed 2006·Granted May 27, 2008·18 cites·11 claims
- 0278US9354272B2Automated loading/unloading of devices for burn-in testingTEOH WAN YEN·Filed 2012·Granted May 31, 2016·3 cites·20 claims
- 0374US7254692B1Testing for operating life of a memory device with address cycling using a gray code sequenceSPANSION LLC·Filed 2004·Granted Aug 7, 2007·26 cites·20 claims
- 0473US8105098B2Automated loading/unloading of devices for burn-in testingTEOH WAN YEN·Filed 2009·Granted Jan 31, 2012·5 cites·22 claims
- 0573US7567076B2Automated loading/unloading of devices for burn-in testingSPANSION LLC·Filed 2008·Granted Jul 28, 2009·5 cites·18 claims
- 0651US8228082B2Automated loading/unloading of devices for burn-in testingTEOH WAN YEN·Filed 2009·Granted Jul 24, 2012·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →