Inventor · disambiguated record
W. T. Kary Chien
Also filed as: CHIEN W T KARY
3 granted patents·11 citations·filing 2005–2008
64Inventor score
Files withSEMICONDUCTOR MFG INT SHANGHAI3
Top patents by PatentIndex Score
3 records- 0168US7396693B2Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuitsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2005·Granted Jul 8, 2008·4 cites·12 claims
- 0267US7619435B2Method and system for derivation of breakdown voltage for MOS integrated circuit devicesSEMICONDUCTOR MFG INT SHANGHAI·Filed 2008·Granted Nov 17, 2009·6 cites·12 claims
- 0356US7573285B2Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuitsSEMICONDUCTOR MFG INT SHANGHAI·Filed 2008·Granted Aug 11, 2009·1 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →