Inventor · disambiguated record
Tzu-Ching Chen
Also filed as: CHEN TZU-CHING
2 granted patents·43 citations·filing 2002–2005
65Inventor score
Technology areasG03F
Files withUNITED MICROELECTRONICS CORP2
Top patents by PatentIndex Score
2 records- 0188US7190824B2Overlay vernier pattern for measuring multi-layer overlay alignment accuracy and method for measuring the sameUNITED MICROELECTRONICS CORP·Filed 2005·Granted Mar 13, 2007·21 cites·9 claims
- 0278US7190823B2Overlay vernier pattern for measuring multi-layer overlay alignment accuracy and method for measuring the sameUNITED MICROELECTRONICS CORP·Filed 2002·Granted Mar 13, 2007·22 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when Tzu-Ching Chen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →