Inventor · disambiguated record
Toshiyuki Syo
Also filed as: SYO TOSHIYUKI
7 granted patents·2 pending applications·41 citations·filing 1997–2022
82Inventor score
Top patents by PatentIndex Score
9 records- 0158US12405604B2Fault prediction device and fault prediction methodRENESAS ELECTRONICS CORP·Filed 2022·Granted Sep 2, 2025·0 cites·10 claims
- 0258US6313648B1Method for quantitating impurity concentration in a semiconductor deviceNEC CORP·Filed 2000·Granted Nov 6, 2001·7 cites·8 claims
- 0339US5880977AMesh generation device and its method for generating meshes having a boundary protective layerNEC CORP·Filed 1997·Granted Mar 9, 1999·13 cites·14 claims
- 0435US2017345925A1Semiconductor device and its manufacturing methodRENESAS ELECTRONICS CORP·Filed 2017·Application pending·0 cites
- 0534US2001041971A1Method of generating mesh and storage medium storing mesh generating programNEC CORP·Filed 2001·Application pending·0 cites
- 0632US6178544B1Simulation mesh generation method, apparatus, and program productNEC CORP·Filed 1998·Granted Jan 23, 2001·7 cites·26 claims
- 0732US6130542AMethod for quantitating impurity concentration in a semiconductor deviceNEC CORP·Filed 1998·Granted Oct 10, 2000·4 cites·4 claims
- 0830US6484305B1Impurity quantity transfer device enabling reduction in pseudo diffusion error generated at integral interpolation of impurity quantities and impurity interpolation method thereofNEC CORP·Filed 1998·Granted Nov 19, 2002·6 cites·21 claims
- 0929US5963732AMethod for simulating impurity diffusion in semiconductor with oxidationNEC CORP·Filed 1997·Granted Oct 5, 1999·4 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →