Inventor · disambiguated record
Tomoyuki Kida
Also filed as: KIDA TOMOYUKI
6 granted patents·100 citations·filing 1991–1998
83Inventor score
Files withNEC CORP6
Top patents by PatentIndex Score
6 records- 0168US6314332B1Multiple semiconductor test system for testing a plurality of different semiconductor typesNEC CORP·Filed 1998·Granted Nov 6, 2001·34 cites·23 claims
- 0257US5249239AMeans for measuring coplanarity of leads on an IC packageNEC CORP·Filed 1991·Granted Sep 28, 1993·38 cites·7 claims
- 0350US5512842AHigh accuracy inspection method and apparatus of semiconductor integrated circuitsNEC CORP·Filed 1994·Granted Apr 30, 1996·16 cites·13 claims
- 0436US6171350B1Apparatus for mounting electronic parts to a mounting bodyNEC CORP·Filed 1994·Granted Jan 9, 2001·6 cites·7 claims
- 0528US5268743AApparatus for measuring flatness of outer leadNEC CORP·Filed 1992·Granted Dec 7, 1993·4 cites·12 claims
- 0627US5412477AApparatus for measuring bend amount of IC leadsNEC CORP·Filed 1993·Granted May 2, 1995·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →