Inventor · disambiguated record
Toru Ibane
Also filed as: IBANE TORU
7 granted patents·26 citations·filing 2002–2007
82Inventor score
Technology areasG01R
Files withADVANTEST CORP7
Top patents by PatentIndex Score
7 records- 0184US7121132B2Method for calibrating semiconductor test instrumentsADVANTEST CORP·Filed 2006·Granted Oct 17, 2006·10 cites·11 claims
- 0269US7043959B2Method for calibrating semiconductor test instrumentADVANTEST CORP·Filed 2002·Granted May 16, 2006·10 cites·11 claims
- 0360US7107815B2Method for calibrating semiconductor test instrumentsADVANTEST CORP·Filed 2006·Granted Sep 19, 2006·2 cites·16 claims
- 0460US7107817B2Method for calibrating semiconductor test instrumentsADVANTEST CORP·Filed 2006·Granted Sep 19, 2006·2 cites·15 claims
- 0552US7111490B2Method for calibrating semiconductor test instrumentsADVANTEST CORP·Filed 2006·Granted Sep 26, 2006·1 cites·16 claims
- 0652US7107816B2Method for calibrating semiconductor test instrumentsADVANTEST CORP·Filed 2006·Granted Sep 19, 2006·1 cites·13 claims
- 0739US7982485B2Semiconductor test device capable of modifying an amplitude of an output signal of a driverADVANTEST CORP·Filed 2007·Granted Jul 19, 2011·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →