Inventor · disambiguated record
Takeshi Shoda
Also filed as: SHODA TAKESHI
2 granted patents·6 citations·filing 2003–2006
44Inventor score
Technology areasG01R
Files withSEMICONDUCTOR TECH ACAD RES CT2
Top patents by PatentIndex Score
2 records- 0150US7299394B2Method and apparatus for determining optimum initial value for test pattern generatorSEMICONDUCTOR TECH ACAD RES CT·Filed 2003·Granted Nov 20, 2007·6 cites·18 claims
- 0240US7702979B2Semiconductor integrated circuit incorporating test configuration and test method for the sameSEMICONDUCTOR TECH ACAD RES CT·Filed 2006·Granted Apr 20, 2010·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →