Inventor · disambiguated record
Taesoo Shin
Also filed as: SHIN TAESOO
0 granted patents·3 pending applications·0 citations·filing 2023–2023
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0150US2024061345A1Methods and systems of detecting defects of waferSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0246US2024135523A1Semiconductor yield prediction method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0346US2024128128A1Method and apparatus for detecting clusters of wafer defectsSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →