Inventor · disambiguated record

Takuro Nagao

Also filed as: NAGAO TAKURO

2 granted patents·8 citations·filing 2003–2020

53Inventor score

Technology areasG06T H10P

Files withNUFLARE TECHNOLOGY INC1 TOSHIBA KK1

Top patents by PatentIndex Score

2 records

0187US12046445B2Electron beam inspection apparatus and electron beam inspection methodNUFLARE TECHNOLOGY INC·Filed 2020·Granted Jul 23, 2024·4 cites·10 claims
0250US7359043B2Pattern inspecting method and pattern inspecting apparatusTOSHIBA KK·Filed 2003·Granted Apr 15, 2008·4 cites·17 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →